Daniel Marienfeld

According to our database1, Daniel Marienfeld authored at least 13 papers between 2002 and 2017.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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PhD thesis 
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Links

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Bibliography

2017
Array Termination Impacts in Advanced SRAM.
IEEE Trans. Very Large Scale Integr. Syst., 2017

2008
New Self-Checking Booth Multipliers.
Int. J. Appl. Math. Comput. Sci., 2008

2007
Effiziente Fehlererkennung für arithmetische Einheiten.
PhD thesis, 2007

2006
Modulo <i>p</i>=3 Checking for a Carry Select Adder.
J. Electron. Test., 2006

A New Self-Checking and Code-Disjoint Non-Restoring Array Divider.
Proceedings of the 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 2006

2005
New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors.
Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005

2004
Self-Checking Code-Disjoint Carry-Select Adder with Low Area Overhead by Use of Add1-Circuits.
Proceedings of the 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 2004

A new self-checking multiplier by use of a code-disjoint sum-bit duplicated adder.
Proceedings of the 9th European Test Symposium, 2004

A New Self-Checking Sum-Bit Duplicated Carry-Select Adder.
Proceedings of the 2004 Design, 2004

Self-checking Carry-selectAdder with Sum-bit Duplication.
Proceedings of the ARCS 2004, 2004

2003
A Modulo p Checked Self-Checking Carry Select Adder.
Proceedings of the 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 2003

2002
A New Self-Checking Code-Disjoint Carry-Skip Adder.
Proceedings of the 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 2002

Partially Duplicated Code-Disjoint Carry-Skip Adder.
Proceedings of the 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 2002


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