Daniela Munteanu
Orcid: 0000-0003-3672-4433
According to our database1,
Daniela Munteanu
authored at least 11 papers
between 2010 and 2017.
Collaborative distances:
Collaborative distances:
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Bibliography
2017
Single-event-transient effects in Junctionless Double-Gate MOSFETs with Dual-Material Gate investigated by 3D simulation.
Microelectron. Reliab., 2017
Multi-Poisson process analysis of real-time soft-error rate measurements in bulk 65 nm and 40 nm SRAMs.
Microelectron. Reliab., 2017
2016
Microelectron. Reliab., 2016
2015
3D simulation of single-event-transient effects in symmetrical dual-material double-gate MOSFETs.
Microelectron. Reliab., 2015
SEU sensitivity of Junctionless Single-Gate SOI MOSFETs-based 6T SRAM cells investigated by 3D TCAD simulation.
Microelectron. Reliab., 2015
ASTEP (2005-2015): Ten years of soft error and atmospheric radiation characterization on the Plateau de Bure.
Microelectron. Reliab., 2015
2014
Radiation sensitivity of junctionless double-gate 6T SRAM cells investigated by 3-D numerical simulation.
Microelectron. Reliab., 2014
Particle Monte Carlo modeling of single-event transient current and charge collection in integrated circuits.
Microelectron. Reliab., 2014
2010
Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level.
Microelectron. Reliab., 2010