David P. Vallett

According to our database, David P. Vallett authored at least 7 papers between 1996 and 2000.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2000

Time-resolved optical characterization of electrical activity in integrated circuits.

James C. Tsang, Jeffrey A. Kash, David P. Vallett

Proc. IEEE, 2000

Picosecond imaging circuit analysis.

James C. Tsang, Jeffrey A. Kash, David P. Vallett

IBM J. Res. Dev., 2000

1999

Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment.

Phil Nigh, David P. Vallett, Atul Patel, Jason Wright, Franco Motika, Donato O. Forlenza, Ray Kurtulik, Wendy Chong

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment.

Phil Nigh, David P. Vallett, Atul Patel, Jason Wright

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

Diagnosis and characterization of timing-related defects by time-dependent light emission.

Daniel R. Knebel, Pia N. Sanda, Moyra K. McManus, Jeffrey A. Kash, James C. Tsang, David P. Vallett, Leendert M. Huisman, Phil Nigh, Rick Rizzolo, Peilin Song, Franco Motika

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997

IC Failure Analysis: The Importance of Test and Diagnostics.

David P. Vallett

IEEE Des. Test Comput., 1997

1996

An Overview of CMOS VLSI Failure Analysis and the Importance of Test and Diagnostics.

David P. Vallett

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996