Peilin Song

Orcid: 0000-0003-4793-3230

According to our database1, Peilin Song authored at least 64 papers between 1996 and 2024.

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Bibliography

2024
Introduction to the Special Issue on Design for Testability and Reliability of Security-aware Hardware.
ACM Trans. Design Autom. Electr. Syst., January, 2024

2023

2022
Securing SoCs With FPGAs Against Rowhammer Attacks.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

Monitoring Ecological Conditions by Remote Sensing and Social Media Data - Sanya City (China) as Case Study.
Remote. Sens., 2022

A Cryo-CMOS Low-Power Semi-Autonomous Transmon Qubit State Controller in 14-nm FinFET Technology.
IEEE J. Solid State Circuits, 2022

Reliability Study of 14 nm Scan Chains and Its Application to Hardware Security.
Proceedings of the IEEE International Test Conference, 2022

Scalable Interactive Autonomous Navigation Simulations on HPC.
Proceedings of the IEEE High Performance Extreme Computing Conference, 2022

Filament Localization and Characterization in Hf02 ReRAM Cells using Laser Stimulation.
Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022

2021
Guest Editorial: Special Section on Emerging Trends and Computing Paradigms for Testing, Reliability and Security in Future VLSI Systems.
IEEE Trans. Emerg. Top. Comput., 2021

Estimating Urban Evapotranspiration at 10m Resolution Using Vegetation Information from Sentinel-2: A Case Study for the Beijing Sponge City.
Remote. Sens., 2021

An Improved Cloud Gap-Filling Method for Longwave Infrared Land Surface Temperatures through Introducing Passive Microwave Techniques.
Remote. Sens., 2021

A BIST-based Dynamic Obfuscation Scheme for Resilience against Removal and Oracle-guided Attacks<sup>*</sup>.
Proceedings of the IEEE International Test Conference, 2021

2020
Guest Editors' Introduction: Selected Papers from IEEE VLSI Test Symposium.
IEEE Des. Test, 2020

Benchmarking at the Frontier of Hardware Security: Lessons from Logic Locking.
CoRR, 2020

BISTLock: Efficient IP Piracy Protection using BIST.
Proceedings of the IEEE International Test Conference, 2020

Detection of Rowhammer Attacks in SoCs with FPGAs.
Proceedings of the IEEE European Test Symposium, 2020

2019
An Improved Soil Moisture Retrieval Algorithm Based on the Land Parameter Retrieval Model for Water-Land Mixed Pixels Using AMSR-E Data.
IEEE Trans. Geosci. Remote. Sens., 2019

Innovate Practices on CyberSecurity of Hardware Semiconductor Devices.
Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Case Study of Advanced Diagnostic Techniques for Multi Port Register File.
Proceedings of the 28th IEEE North Atlantic Test Workshop, 2019

Monitoring Locusta migratoria manilensis damage using ground level hyperspectral data.
Proceedings of the 8th International Conference on Agro-Geoinformatics, 2019

2018
Estimating transistor channel temperature using time-resolved and time-integrated NIR emission.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

Novel IC Sub-Threshold IDDQ Signature And Its Relationship To Aging During High Voltage Stress.
Proceedings of the 48th European Solid-State Device Research Conference, 2018

Mapping of Oriental Migratory Locust Habitat Using Landsat OLI Images in Dongying City, China.
Proceedings of the 2018 7th International Conference on Agro-geoinformatics (Agro-geoinformatics), 2018

2017
Mapping Above-Ground Biomass of Winter Oilseed Rape Using High Spatial Resolution Satellite Data at Parcel Scale under Waterlogging Conditions.
Remote. Sens., 2017

Innovative practices session 3C hardware security.
Proceedings of the 35th IEEE VLSI Test Symposium, 2017

Paddy rice field mapping using GF-1 images with SVM method.
Proceedings of the 2017 6th International Conference on Agro-Geoinformatics, 2017

2016
Revealing SRAM memory content using spontaneous photon emission.
Proceedings of the 34th IEEE VLSI Test Symposium, 2016

2015
Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

Time-integrated photon emission as a function of temperature in 32 nm CMOS.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

Analyzing path delays for accelerated testing of logic chips.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014
Functional block extraction for hardware security detection using time-integrated and time-resolved emission measurements.
Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Counterfeit IC detection using light emission.
Proceedings of the 2014 International Test Conference, 2014

Verification of untrusted chips using trusted layout and emission measurements.
Proceedings of the 2014 IEEE International Symposium on Hardware-Oriented Security and Trust, 2014

2012
Tester-based optical and electrical diagnostic system and techniques.
Proceedings of the 30th IEEE VLSI Test Symposium, 2012

Root cause identification of an hard-to-find on-chip power supply coupling fail.
Proceedings of the 2012 IEEE International Test Conference, 2012

Can EDA combat the rise of electronic counterfeiting?
Proceedings of the 49th Annual Design Automation Conference 2012, 2012

2011
MARVEL - Malicious alteration recognition and verification by emission of light.
Proceedings of the HOST 2011, 2011

2010
Characterization of Random Process Variations Using Ultralow-Power, High-Sensitivity, Bias-Free Sub-Threshold Process Sensor.
IEEE Trans. Circuits Syst. I Regul. Pap., 2010

2009
A Class of New AC-DC-AC Matrix Converter ACCMC.
Proceedings of the International Conference on Networked Computing and Advanced Information Management, 2009

On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC).
Proceedings of the 2009 IEEE International Test Conference, 2009

2008
Design of Comprehensive High-fidelity/High-speed Virtual Simulation System for Lunar Rover.
Proceedings of the 2008 IEEE Conference on Robotics, Automation and Mechatronics, 2008

Optical Diagnostics for IBM POWER6- Microprocessor.
Proceedings of the 2008 IEEE International Test Conference, 2008

A high sensitivity process variation sensor utilizing sub-threshold operation.
Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, 2008

2006
High-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images.
Proceedings of the 2006 IEEE International Test Conference, 2006

2005
Characterization of a 0.13 mum CMOS Link Chip using Time Resolved Emission (TRE).
Microelectron. Reliab., 2005

Photon emission microscopy of inter/intra chip device performance variations.
Microelectron. Reliab., 2005

An advanced optical diagnostic technique of IBM z990 eServer microprocessor.
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

Characterizing the VCO jitter due to the digital simultaneous switching noise.
Proceedings of the 15th ACM Great Lakes Symposium on VLSI 2005, 2005

2004
Testing of Ultra Low Voltage VLSI Chips using the Superconducting Single-Photon Detector (SSPD).
Microelectron. Reliab., 2004

A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current.
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Delay chain based programmable jitter generator.
Proceedings of the 9th European Test Symposium, 2004

2003
Latchup Analysis Using Emission Microscopy.
Microelectron. Reliab., 2003

Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling.
Microelectron. Reliab., 2003

Optical and Electrical Testing of Latchup in I/O Interface Circuits.
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002
Optical diagnosis of excess I<sub>DDQ</sub> in low power CMOS circuits.
Microelectron. Reliab., 2002

An overview of the BlueGene/L Supercomputer.
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Proceedings of the 2002 ACM/IEEE conference on Supercomputing, 2002


1999
S/390 G5 CMOS microprocessor diagnostics.
IBM J. Res. Dev., 1999

Diagnostic techniques for the IBM S/390 600 MHz G5 microprocessor.
Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998
Microprocessor test and test tool methodology for the 500 MHz IBM S/390 G5 chip.
Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

Diagnosis and characterization of timing-related defects by time-dependent light emission.
Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997
Principles for design of position and force controllers for robot manipulators.
Robotics Auton. Syst., 1997

1996
Fundamental principles of design of position and force controller for robot manipulators.
Proceedings of the 1996 IEEE International Conference on Robotics and Automation, 1996

Test Sequence Generation for Realistic Faults in CMOS ICs Based on Standard Cell Library.
Proceedings of the 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 1996


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