Peilin Song
Orcid: 0000-0003-4793-3230
According to our database1,
Peilin Song
authored at least 64 papers
between 1996 and 2024.
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Bibliography
2024
Introduction to the Special Issue on Design for Testability and Reliability of Security-aware Hardware.
ACM Trans. Design Autom. Electr. Syst., January, 2024
2023
Proceedings of the IEEE Custom Integrated Circuits Conference, 2023
2022
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022
Monitoring Ecological Conditions by Remote Sensing and Social Media Data - Sanya City (China) as Case Study.
Remote. Sens., 2022
A Cryo-CMOS Low-Power Semi-Autonomous Transmon Qubit State Controller in 14-nm FinFET Technology.
IEEE J. Solid State Circuits, 2022
Proceedings of the IEEE International Test Conference, 2022
Proceedings of the IEEE High Performance Extreme Computing Conference, 2022
Filament Localization and Characterization in Hf02 ReRAM Cells using Laser Stimulation.
Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022
2021
Guest Editorial: Special Section on Emerging Trends and Computing Paradigms for Testing, Reliability and Security in Future VLSI Systems.
IEEE Trans. Emerg. Top. Comput., 2021
Estimating Urban Evapotranspiration at 10m Resolution Using Vegetation Information from Sentinel-2: A Case Study for the Beijing Sponge City.
Remote. Sens., 2021
An Improved Cloud Gap-Filling Method for Longwave Infrared Land Surface Temperatures through Introducing Passive Microwave Techniques.
Remote. Sens., 2021
A BIST-based Dynamic Obfuscation Scheme for Resilience against Removal and Oracle-guided Attacks<sup>*</sup>.
Proceedings of the IEEE International Test Conference, 2021
2020
IEEE Des. Test, 2020
CoRR, 2020
Proceedings of the IEEE International Test Conference, 2020
Proceedings of the IEEE European Test Symposium, 2020
2019
An Improved Soil Moisture Retrieval Algorithm Based on the Land Parameter Retrieval Model for Water-Land Mixed Pixels Using AMSR-E Data.
IEEE Trans. Geosci. Remote. Sens., 2019
Proceedings of the 37th IEEE VLSI Test Symposium, 2019
Proceedings of the 28th IEEE North Atlantic Test Workshop, 2019
Monitoring Locusta migratoria manilensis damage using ground level hyperspectral data.
Proceedings of the 8th International Conference on Agro-Geoinformatics, 2019
2018
Estimating transistor channel temperature using time-resolved and time-integrated NIR emission.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
Novel IC Sub-Threshold IDDQ Signature And Its Relationship To Aging During High Voltage Stress.
Proceedings of the 48th European Solid-State Device Research Conference, 2018
Mapping of Oriental Migratory Locust Habitat Using Landsat OLI Images in Dongying City, China.
Proceedings of the 2018 7th International Conference on Agro-geoinformatics (Agro-geoinformatics), 2018
2017
Mapping Above-Ground Biomass of Winter Oilseed Rape Using High Spatial Resolution Satellite Data at Parcel Scale under Waterlogging Conditions.
Remote. Sens., 2017
Proceedings of the 35th IEEE VLSI Test Symposium, 2017
Proceedings of the 2017 6th International Conference on Agro-Geoinformatics, 2017
2016
Proceedings of the 34th IEEE VLSI Test Symposium, 2016
2015
Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements.
Proceedings of the IEEE International Reliability Physics Symposium, 2015
Proceedings of the IEEE International Reliability Physics Symposium, 2015
Proceedings of the IEEE International Reliability Physics Symposium, 2015
2014
Functional block extraction for hardware security detection using time-integrated and time-resolved emission measurements.
Proceedings of the 32nd IEEE VLSI Test Symposium, 2014
Proceedings of the 2014 International Test Conference, 2014
Proceedings of the 2014 IEEE International Symposium on Hardware-Oriented Security and Trust, 2014
2012
Proceedings of the 30th IEEE VLSI Test Symposium, 2012
Proceedings of the 2012 IEEE International Test Conference, 2012
Proceedings of the 49th Annual Design Automation Conference 2012, 2012
2011
Proceedings of the HOST 2011, 2011
2010
Characterization of Random Process Variations Using Ultralow-Power, High-Sensitivity, Bias-Free Sub-Threshold Process Sensor.
IEEE Trans. Circuits Syst. I Regul. Pap., 2010
2009
Proceedings of the International Conference on Networked Computing and Advanced Information Management, 2009
On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC).
Proceedings of the 2009 IEEE International Test Conference, 2009
2008
Design of Comprehensive High-fidelity/High-speed Virtual Simulation System for Lunar Rover.
Proceedings of the 2008 IEEE Conference on Robotics, Automation and Mechatronics, 2008
Proceedings of the 2008 IEEE International Test Conference, 2008
Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, 2008
2006
High-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images.
Proceedings of the 2006 IEEE International Test Conference, 2006
2005
Microelectron. Reliab., 2005
Microelectron. Reliab., 2005
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005
Proceedings of the 15th ACM Great Lakes Symposium on VLSI 2005, 2005
2004
Testing of Ultra Low Voltage VLSI Chips using the Superconducting Single-Photon Detector (SSPD).
Microelectron. Reliab., 2004
A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current.
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004
Proceedings of the 9th European Test Symposium, 2004
2003
Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling.
Microelectron. Reliab., 2003
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003
2002
Microelectron. Reliab., 2002
Proceedings of the 2002 ACM/IEEE conference on Supercomputing, 2002
Proceedings of the 2002 IEEE International Conference on Cluster Computing (CLUSTER 2002), 2002
1999
Proceedings of the Proceedings IEEE International Test Conference 1999, 1999
1998
Proceedings of the Proceedings IEEE International Test Conference 1998, 1998
Diagnosis and characterization of timing-related defects by time-dependent light emission.
Proceedings of the Proceedings IEEE International Test Conference 1998, 1998
1997
Robotics Auton. Syst., 1997
1996
Fundamental principles of design of position and force controller for robot manipulators.
Proceedings of the 1996 IEEE International Conference on Robotics and Automation, 1996
Test Sequence Generation for Realistic Faults in CMOS ICs Based on Standard Cell Library.
Proceedings of the 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 1996