Phil Nigh

According to our database, Phil Nigh authored at least 40 papers between 1988 and 2016.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2016

Testing in the year 2024 - big changes are coming.

Phil Nigh

Proceedings of the 21th IEEE European Test Symposium, 2016

2014

Board manufacturing test correlation to IC manufacturing test.

C. Glenn Shirley, W. Robert Daasch, Phil Nigh, Zoe Conroy

Proceedings of the 2014 International Test Conference, 2014

2013

Adaptive testing - Cost reduction through test pattern sampling.

Matt Grady, Bradley Pepper, Joshua Patch, Michael Degregorio, Phil Nigh

Proceedings of the 2013 IEEE International Test Conference, 2013

2012

Physically-Aware N-Detect Test.

Yen-Tzu Lin, Osei Poku, R. D. (Shawn) Blanton, Phil Nigh, Peter Lloyd, Vikram Iyengar

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

Guest Editors' Introduction: Yield Learning Processes and Methods.

Anne E. Gattiker, Phil Nigh

IEEE Des. Test Comput., 2012

How are failure modes, defect types and test methods changing for 32nm/28nm technologies and beyond?

Phil Nigh

Proceedings of the 2012 IEEE International Test Conference, 2012

2011

Industry leaders panel - How will testing change in the next 10 years?

Phil Nigh

Proceedings of the 2011 IEEE International Test Conference, 2011

Using well/substrate bias manipulation to enhance voltage-test-based defect detection.

Anne E. Gattiker, Phil Nigh

Proceedings of the 2011 IEEE International Test Conference, 2011

2009

Application of non-parametric statistics of the parametric response for defect diagnosis.

Rama Gudavalli, W. Robert Daasch, Phil Nigh, Douglas Heaberlin

Proceedings of the 2009 IEEE International Test Conference, 2009

2008

How Many Test Patterns are Useless?

François-Fabien Ferhani, Nirmal R. Saxena, Edward J. McCluskey, Phil Nigh

Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008

Evaluating the Effectiveness of Physically-Aware N-Detect Test using Real Silicon.

Yen-Tzu Lin, Osei Poku, Ronald D. Blanton, Phil Nigh, Peter Lloyd, Vikram Iyengar

Proceedings of the 2008 IEEE International Test Conference, 2008

The Evolving Role of Test ... it is now a "Value Add" Operation.

Phil Nigh

Proceedings of the 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 2008

2006

Guest Editor's Introduction: Evolving Methods for Detecting and Handling Reliability Defects.

Phil Nigh

IEEE Des. Test Comput., 2006

Session Abstract.

Phil Nigh

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

2005

Defect-Oriented Test for Ultra-Low DPM.

Vikram Iyengar, Phil Nigh

Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005

2004

Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions.

Phil Nigh, Anne E. Gattiker

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Redefining ATE: "Data Collection Engines that Drive Yield Learning and Process Optimization".

Phil Nigh

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Achieving Quality Levels of 100dpm: It's possible - but roll up your sleeves and be prepared to do some work..

Phil Nigh

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

The Increasing Importance of On-line Testing to Ensure High-Reliability Products.

Phil Nigh

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Debating the Future of Burn-In.

Edward J. McCluskey, Subhasish Mitra, Bob Madge, Peter C. Maxwell, Phil Nigh, Mike Rodgers

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

Scan-Based Testing: The Only Practical Solution for Testing ASIC/Consumer Products.

Phil Nigh

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

MINVDD Testing for Weak CMOS ICs.

Chao-Wen Tseng, Ray Chen, Edward J. McCluskey, Phil Nigh

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

2000

Test method evaluation experiments and data.

Phil Nigh, Anne E. Gattiker

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1999

Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment.

Phil Nigh, David P. Vallett, Atul Patel, Jason Wright, Franco Motika, Donato O. Forlenza, Ray Kurtulik, Wendy Chong

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

Best Methods for At-Speed Testing?

Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998

Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment.

Phil Nigh, David P. Vallett, Atul Patel, Jason Wright

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

SIA Roadmap: test must not limit future technologies.

Phil Nigh

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

Diagnosis and characterization of timing-related defects by time-dependent light emission.

Daniel R. Knebel, Pia N. Sanda, Moyra K. McManus, Jeffrey A. Kash, James C. Tsang, David P. Vallett, Leendert M. Huisman, Phil Nigh, Rick Rizzolo, Peilin Song, Franco Motika

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

Binning for IC Quality: Experimental Studies on the SEMATECH Data.

Adit D. Singh, David R. Lakin II, Gaurav Sinha, Phil Nigh

Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '98), 1998

1997

An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing.

Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken

Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997

Screening for Known Good Die (KGD) Based on Defect Clustering: An Experimental Study.

Adit D. Singh, Phil Nigh, C. Mani Krishna

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment.

Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

Application and Analysis of IDDQ Diagnostic Software.

Phil Nigh, Donato O. Forlenza, Franco Motika

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1996

Volume Manufacturing - ICs and Boards: DFT to the Rescue?

Robert C. Aitken, J. Hutcheson, N. Murthy, Phil Nigh, Nicholas Sporck

Proceedings of the 14th IEEE VLSI Test Symposium (VTS'96), April 28, 1996

1994

ASIC Test Cost/Strategy Trade-offs.

Donald L. Wheater, Phil Nigh, Jeanne Trinko Mechler, Luke Lacroix

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1990

Test Generation for Current Testing (CMOS ICs).

Phil Nigh, Wojciech Maly

IEEE Des. Test Comput., 1990

1989

Layout-driven test generation.

Phil Nigh, Wojciech Maly

Proceedings of the 1989 IEEE International Conference on Computer-Aided Design, 1989

1988

Current sensing for built-in testing of CMOS circuits.

Derek Feltham, Phil Nigh, L. Richard Carley, Wojciech Maly

Proceedings of the Computer Design: VLSI in Computers and Processors, 1988

Testing oriented analysis of CMOS ICs with opens.

Wojciech Maly, Pranab K. Nag, Phil Nigh

Proceedings of the 1988 IEEE International Conference on Computer-Aided Design, 1988

Built-in current testing-feasibility study.

Wojciech Maly, Phil Nigh

Proceedings of the 1988 IEEE International Conference on Computer-Aided Design, 1988