Franco Motika

According to our database, Franco Motika authored at least 7 papers between 1983 and 2009.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2009

Structural and functional test of IBM System z10 chips.

Gerard Salem, D. W. Wittig, Thomas G. Foote, Bryan J. Robbins, C. Hirko, Donato O. Forlenza, Franco Motika, J. A. Kyle, Mary P. Kusko, Orazio P. Forlenza, R. J. Frishmuth, Rona Yaari, S. Michnowski, U. Baur

IBM J. Res. Dev., 2009

1999

S/390 G5 CMOS microprocessor diagnostics.

Peilin Song, Franco Motika, Daniel R. Knebel, Richard F. Rizzolo, Mary P. Kusko

IBM J. Res. Dev., 1999

Diagnostic techniques for the IBM S/390 600 MHz G5 microprocessor.

Peilin Song, Franco Motika, Daniel R. Knebel, Rick Rizzolo, Mary P. Kusko, Julie Lee, Moyra K. McManus

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment.

Phil Nigh, David P. Vallett, Atul Patel, Jason Wright, Franco Motika, Donato O. Forlenza, Ray Kurtulik, Wendy Chong

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

Diagnosis and characterization of timing-related defects by time-dependent light emission.

Daniel R. Knebel, Pia N. Sanda, Moyra K. McManus, Jeffrey A. Kash, James C. Tsang, David P. Vallett, Leendert M. Huisman, Phil Nigh, Rick Rizzolo, Peilin Song, Franco Motika

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997

Application and Analysis of IDDQ Diagnostic Software.

Phil Nigh, Donato O. Forlenza, Franco Motika

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1983

An LSSD Pseudo Random Pattern Test System.

Franco Motika, John A. Waicukauski, Edward B. Eichelberger, Eric Lindbloom

Proceedings of the Proceedings International Test Conference 1983, 1983