Moyra K. McManus

According to our database, Moyra K. McManus authored at least 10 papers between 1998 and 2013.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2013

Design for low power and power management in IBM Blue Gene/Q.

Krishnan Sugavanam, Chen-Yong Cher, John A. Gunnels, Ruud A. Haring, Philip Heidelberger, Hans M. Jacobson, Moyra K. McManus, D. P. Paulsen, David L. Satterfield, Yutaka Sugawara, Robert Walkup

IBM J. Res. Dev., 2013

2005

An advanced optical diagnostic technique of IBM z990 eServer microprocessor.

Peilin Song, Franco Stellari, Bill Huott, Otto Wagner, Uma Srinivasan, Yuen H. Chan, Rick Rizzolo, H. J. Nam, James P. Eckhardt, Timothy G. McNamara, Ching-Lung Tong, Alan J. Weger, Moyra K. McManus

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2003

Latchup Analysis Using Emission Microscopy.

Franco Stellari, Peilin Song, Moyra K. McManus, Alan J. Weger, Robert Gauthier, Kiran V. Chatty, Mujahid Muhammad, Pia N. Sanda, Philip Wu, Steve Wilson

Microelectron. Reliab., 2003

Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling.

Romain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari

Microelectron. Reliab., 2003

Optical and Electrical Testing of Latchup in I/O Interface Circuits.

Franco Stellari, Peilin Song, Moyra K. McManus, Robert Gauthier, Alan J. Weger, Kiran V. Chatty, Mujahid Muhammad, Pia N. Sanda

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Optical diagnosis of excess I_DDQ in low power CMOS circuits.

Franco Stellari, Peilin Song, James C. Tsang, Moyra K. McManus, Mark B. Ketchen

Microelectron. Reliab., 2002

2000

Non-invasive timing analysis of IBM G6 microprocessor L1 cache using picosecond imaging circuit analysis.

Stanislav Polonsky, Moyra K. McManus, Daniel R. Knebel, Steve Steen, Pia N. Sanda

Proceedings of the 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, 2000

1999

Diagnostic techniques for the IBM S/390 600 MHz G5 microprocessor.

Peilin Song, Franco Motika, Daniel R. Knebel, Rick Rizzolo, Mary P. Kusko, Julie Lee, Moyra K. McManus

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

The attack of the "Holey Shmoos": a case study of advanced DFD and picosecond imaging circuit analysis (PICA).

William V. Huott, Moyra K. McManus, Daniel R. Knebel, Steve Steen, Dennis Manzer, Pia N. Sanda, Steve Wilson, Yuen H. Chan, Antonio Pelella, Stanislav Polonsky

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

Diagnosis and characterization of timing-related defects by time-dependent light emission.

Daniel R. Knebel, Pia N. Sanda, Moyra K. McManus, Jeffrey A. Kash, James C. Tsang, David P. Vallett, Leendert M. Huisman, Phil Nigh, Rick Rizzolo, Peilin Song, Franco Motika

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998