Dinesh Badami

According to our database, Dinesh Badami authored at least 3 papers between 2004 and 2015.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2015

A case study of electromigration reliability: From design point to system operations.

Baozhen Li, K. Paul Muller, James D. Warnock, Leon J. Sigal, Dinesh Badami

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014

Electromigration challenges for advanced on-chip Cu interconnects.

Baozhen Li, Cathryn Christiansen, Dinesh Badami, Chih-Chao Yang

Microelectron. Reliab., 2014

2004

Reliability challenges for copper interconnects.

Baozhen Li, Timothy D. Sullivan, Tom C. Lee, Dinesh Badami

Microelectron. Reliab., 2004