Dominik Kasprowicz

According to our database, Dominik Kasprowicz authored at least 11 papers between 2001 and 2019.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2019

Table-Based Model of a Dual-Gate Transistor for Statistical Circuit Simulation.

Dominik Kasprowicz

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019

Semiconductor Device Parameter Extraction Based on I-V Measurements and Simulation.

Dominik Kasprowicz

Proceedings of the 26th International Conference on Mixed Design of Integrated Circuits and Systems, 2019

2017

Variability-aware table-based DC model of a dual-gate transistor.

Dominik Kasprowicz

Proceedings of the 24th International Conference Mixed Design of Integrated Circuits and Systems, 2017

2015

Channel charge model of a dual-gate junctionless transistor.

Dominik Kasprowicz

Proceedings of the 22nd International Conference Mixed Design of Integrated Circuits & Systems, 2015

2014

Methods for automated detection of plagiarism in integrated-circuit layouts.

Dominik Kasprowicz, Hilekaan Wada

Microelectron. J., 2014

2013

Computer-aided detection of plagiarism in integrated-circuit layouts.

Dominik Kasprowicz, Hilekaan Wada

Proceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems, 2013

VeSFET as an analog-circuit component.

Dominik Kasprowicz, Bartosz Swacha

Proceedings of the 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2013

2009

Adder Circuits with Transistors using Independently Controlled Gates.

Marcus Weis, Andrzej Pfitzner, Dominik Kasprowicz, Rainer Emling, Wojciech Maly, Doris Schmitt-Landsiedel

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2009), 2009

2008

Is there always performance overhead for regular fabric?

Yi-Wei Lin, Malgorzata Marek-Sadowska, Wojciech Maly, Andrzej Pfitzner, Dominik Kasprowicz

Proceedings of the 26th International Conference on Computer Design, 2008

2003

Improvement of integrated circuit testing reliability by using the defect based approach.

Dominik Kasprowicz, Witold A. Pleskacz

Microelectron. Reliab., 2003

2001

CMOS Standard Cells Characterization for Defect Based Testing.

Witold A. Pleskacz, Dominik Kasprowicz, Tomasz Oleszczak, Wieslaw Kuzmicz

Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001