Don Pearl

According to our database, Don Pearl authored at least 4 papers between 2000 and 2014.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2014

Efficient testing of hierarchical core-based SOCs.

Brion L. Keller, Krishna Chakravadhanula, Brian Foutz, Vivek Chickermane, Akhil Garg, Richard Schoonover, James Sage, Don Pearl, Thomas J. Snethen

Proceedings of the 2014 International Test Conference, 2014

2013

SmartScan - Hierarchical test compression for pin-limited low power designs.

Krishna Chakravadhanula, Vivek Chickermane, Don Pearl, Akhil Garg, R. Khurana, Subhasish Mukherjee, P. Nagaraj

Proceedings of the 2013 IEEE International Test Conference, 2013

2000

Test structure verification of logical BIST: problems and solutions.

Michael Cogswell, Don Pearl, James Sage, Alan Troidl

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

An Automatic Validation Methodology for Logic BIST in High Performance VLSI Design.

Michael Cogswell, Don Pearl, James Sage, Alan Troidl

Proceedings of the IEEE International Conference On Computer Design: VLSI In Computers & Processors, 2000