Duoli Li

According to our database, Duoli Li authored at least 3 papers between 2019 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

Single-Event Upset Monitor-Based Radiation-Hardened Latch for Multi-Node Upset.

Zhan Zheyu, Hainan Liu, Duoli Li, Ma Quangang, Wenxin Zhao, Zhenzhen Yan, Bo Li

IEEE Trans. Circuits Syst. II Express Briefs, August, 2025

2023

Influence of Back Gate Bias on the Hot Carrier Reliability of DSOI nMOSFET.

Xinyi Zhang, Kewei Wang, Fang Wang, Jiangjiang Li, Zhicheng Wu, Duoli Li, Bo Li, Jianhui Bu, Zhengsheng Han

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2019

Effect of Radiation on Interface Traps of SOI NMOSFETs by the Direct-Current Current-Voltage Technique.

Yangyang Li, Xiaojing Li, Bo Li, Linchun Gao, Weiwei Yan, Fangfang Wang, Duoli Li, Chuanbin Zeng, Jiajun Luo, Zhengsheng Han

IEEE Access, 2019