Jiajun Luo

Orcid: 0000-0003-2645-3676

According to our database1, Jiajun Luo authored at least 19 papers between 2017 and 2024.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Bibliography

2024
Learning-Based Autonomous Channel Access in the Presence of Hidden Terminals.
IEEE Trans. Mob. Comput., May, 2024

2023
FedLP: Layer-Wise Pruning Mechanism for Communication-Computation Efficient Federated Learning.
Proceedings of the IEEE International Conference on Communications, 2023

Deep Reinforcement Learning based Dynamic Channel Bonding for Wi-Fi Networks.
Proceedings of the IEEE Intl Conf on Parallel & Distributed Processing with Applications, 2023

2022
Deep Learning Based MAC via Joint Channel Access and Rate Adaptation.
Proceedings of the 95th IEEE Vehicular Technology Conference, 2022

Single Event Induced Crosstalk of Monolithic 3D Circuits Based on a 22 nm FD-SOI Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

The Synergetic Effects of Total Ionizing Dose and High Temperature on 180 nm DSOI Technology.
Proceedings of the IEEE Asia Pacific Conference on Circuit and Systems, 2022

2021
Deep Learning for Intelligent Wireless MAC: Exploiting Real Data Sampled on 2.4GHz Frequency Band.
CoRR, 2021

QoE- Driven Resource Allocation for Secure URLLC in 6G-Enabled IoT Networks.
Proceedings of the 13th International Conference on Wireless Communications and Signal Processing, 2021

Achievable Harvested Energy Region of IRS-Assisted Wireless Power Transfer System.
Proceedings of the 13th International Conference on Wireless Communications and Signal Processing, 2021

AI-Aided Channel Quality Assessment for Bluetooth Adaptive Frequency Hopping.
Proceedings of the 32nd IEEE Annual International Symposium on Personal, 2021

2019
Snapback-free base resistance controlled thyristor with floating N-region.
IEICE Electron. Express, 2019

A new snapback-free base resistance controlled thyristor with semi-superjunction.
IEICE Electron. Express, 2019

Effect of Radiation on Interface Traps of SOI NMOSFETs by the Direct-Current Current-Voltage Technique.
IEEE Access, 2019

Influences of the Source and Drain Resistance of the MOSFETs on the Single Event Upset Hardness of SRAM cells.
Proceedings of the 13th IEEE International Conference on ASIC, 2019

2018
Process variation dependence of total ionizing dose effects in bulk nFinFETs.
Microelectron. Reliab., 2018

Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment.
Microelectron. Reliab., 2018

No Spurious Local Minima in a Two Hidden Unit ReLU Network.
Proceedings of the 6th International Conference on Learning Representations, 2018

2017
System Analysis and PHM Methods for Power Devices Based on Physics-of-Failure.
Proceedings of the International Conference on Dependable Systems and Their Applications, 2017

Roles of the gate length and width of the transistors in increasing the single event upset resistance of SRAM cells.
Proceedings of the 12th IEEE International Conference on ASIC, 2017


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