Jianhui Bu

According to our database, Jianhui Bu authored at least 3 papers between 2018 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Influence of Back Gate Bias on the Hot Carrier Reliability of DSOI nMOSFET.

Xinyi Zhang, Kewei Wang, Fang Wang, Jiangjiang Li, Zhicheng Wu, Duoli Li, Bo Li, Jianhui Bu, Zhengsheng Han

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2019

Multi-task Sentence Encoding Model for Semantic Retrieval in Question Answering Systems.

Qiang Huang, Jianhui Bu, Weijian Xie, Shengwen Yang, Weijia Wu, Liping Liu

Proceedings of the International Joint Conference on Neural Networks, 2019

2018

Process variation dependence of total ionizing dose effects in bulk nFinFETs.

Bo Li, Yunbo Huang, Ling Yang, Qingzhu Zhang, Zhongshan Zheng, Binhong Li, Huiping Zhu, Jianhui Bu, Huaxiang Yin, Jiajun Luo, Zhengsheng Han, Haibin Wang

Microelectron. Reliab., 2018