Edward Li

According to our database1, Edward Li authored at least 13 papers between 2004 and 2023.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2023
An Empirical Study of AI-based Smart Contract Creation.
CoRR, 2023

Who is Smarter? An Empirical Study of AI-Based Smart Contract Creation.
Proceedings of the 5th Conference on Blockchain Research & Applications for Innovative Networks and Services, 2023

2021
Distilling Large Language Models into Tiny and Effective Students using pQRNN.
CoRR, 2021

2020
Holopix50k: A Large-Scale In-the-wild Stereo Image Dataset.
CoRR, 2020

GPU-Accelerated Mobile Multi-view Style Transfer.
CoRR, 2020

2018
Identifying Domain Adjacent Instances for Semantic Parsers.
Proceedings of the 2018 Conference on Empirical Methods in Natural Language Processing, Brussels, Belgium, October 31, 2018

2016
Sparse reconstruction of compressive sensing MRI using cross-domain stochastically fully connected conditional random fields.
BMC Medical Imaging, 2016

Sparse Reconstruction of Compressive Sensing Multi-Spectral Data Using an Inter-Spectral Multi-Layered Conditional Random Field Model.
IEEE Access, 2016

A unified Bayesian-based compensated magnetic resonance imaging.
Proceedings of the 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, 2016

2015
Dense Depth Map Reconstruction from Sparse Measurements Using a Multilayer Conditional Random Field Model.
Proceedings of the 12th Conference on Computer and Robot Vision, 2015

2014
Sea Ice Surface Temperature Estimation Using MODIS and AMSR-E Data Within a Guided Variational Model Along the Labrador Coast.
IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens., 2014

2013
Continuous sea ice thickness estimation using a joint MODIS and AMSR-E guided variational model.
Proceedings of the 2013 IEEE International Geoscience and Remote Sensing Symposium, 2013

2004
ELF-Murphy Data on Defects and Test Sets.
Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004


  Loading...