François-Fabien Ferhani

According to our database, François-Fabien Ferhani authored at least 3 papers between 2004 and 2008.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2008

How Many Test Patterns are Useless?

François-Fabien Ferhani, Nirmal R. Saxena, Edward J. McCluskey, Phil Nigh

Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008

2006

Classifying Bad Chips and Ordering Test Sets.

François-Fabien Ferhani, Edward J. McCluskey

Proceedings of the 2006 IEEE International Test Conference, 2006

2004

ELF-Murphy Data on Defects and Test Sets.

Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, François-Fabien Ferhani, Edward Li, Subhasish Mitra

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004