Elisa Petroni

According to our database, Elisa Petroni authored at least 7 papers between 2021 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Unveiling Retention Physical Mechanism of Ge-rich GST ePCM Technology.

Luca Laurin, Matteo Baldo, Elisa Petroni, Giulia Samanni, Lorenzo Turconi, A. Motta, Massimo Borghi, A. Serafini, D. Codegoni, M. Scuderi, S. Ran, A. Claverie, Daniele Ielmini, Roberto Annunziata, Andrea Redaelli

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Enhancing reliability of a strong physical unclonable function (PUF) solution based on virgin-state phase change memory (PCM).

L. Cattaneo, Matteo Baldo, Nicola Lepri, Flavio Sancandi, Massimo Borghi, Elisa Petroni, A. Serafini, Roberto Annunziata, Andrea Redaelli, Daniele Ielmini

Proceedings of the IEEE International Reliability Physics Symposium, 2023

ePCM reliability improvement through active material carbon implantation.

Elisabetta Palumbo, Alessandro Motta, Elisa Petroni, Daniele Gallinari, Annalisa Gilardini, Amos Galbiati, Massimo Borghi, Roberto Annunziata, Andrea Redaelli

Proceedings of the 53rd IEEE European Solid-State Device Research Conference, 2023

2022

Interaction between forming pulse and integration process flow in ePCM.

Matteo Baldo, Elisa Petroni, Luca Laurin, Giulia Samanni, Octavian Melinc, Daniele Ielmini, Andrea Redaelli

Proceedings of the 17th Conference on Ph.D Research in Microelectronics and Electronics, 2022

Modeling Environment for Ge-rich GST Phase Change Memory Cells.

Matteo Baldo, Luca Laurin, Elisa Petroni, Giulia Samanni, M. Allegra, Enrico Gomiero, Daniele Ielmini, Andrea Redaelli

Proceedings of the IEEE International Memory Workshop, 2022

Characterization of reset state through energy activation study in Ge-GST based ePCM.

Matteo Baldo, Lorenzo Turconi, Alessandro Motta, Elisa Petroni, Luca Laurin, Daniele Ielmini, Andrea Redaelli

Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022

2021

Improving Ge-rich GST ePCM reliability through BEOL engineering.

Andrea Redaelli, Anna Gandolfo, Giulia Samanni, Enrico Gomiero, Elisa Petroni, Luca Scotti, Andrea Lippiello, Paolo Mattavelli, J. Jasse, D. Codegoni, A. Serafini, Rossella Ranica, Christian Boccaccio, Jury Sandrini, R. Berthelon, J. C. Grenier, Olivier Weber, David Turgis, A. Valery, S. Del Medico, V. Caubet, J. P. Reynard, Didier Dutartre, L. Favennec, Antonino Conte, Fabio Disegni, M. De Tomasi, A. Ventre, Matteo Baldo, Daniele Ielmini, Alfonso Maurelli, P. Ferreira, Franck Arnaud, F. Piazza, Paolo Cappelletti, Roberto Annunziata, R. Gonella

Proceedings of the 51st IEEE European Solid-State Device Research Conference, 2021