Emmanuel Nolot

According to our database, Emmanuel Nolot authored at least 5 papers between 2018 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2022

Multilayer Deposition in Phase-Change Memory for Best Endurance Performance and Reduced Bit Error Rate.

Gabriele Navarro, C. Sabbione, Valentina Meli, L. E. Nistor, M. Frei, Julien Garrione, M. Tessaire, F. Fillot, Nicolas Bernier, Emmanuel Nolot, Benoit Sklénard, J. Li, S. Martin, Niccolo Castellani, Guillaume Bourgeois, Marie Claire Cyrille, François Andrieu

Proceedings of the IEEE International Memory Workshop, 2022

Multilayer Structure in SeAsGeSi-based OTS for High Thermal Stability and Reliability Enhancement.

Camille Laguna, Mathieu Bernard, Julien Garrione, Niccolo Castellani, Valentina Meli, S. Martin, François Aussenac, D. Rouchon, N. Rochat, Emmanuel Nolot, Guillaume Bourgeois, Marie Claire Cyrille, Liviu Militaru, A. Souifi, François Andrieu, Gabriele Navarro

Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022

2021

Multilevel Programming Reliability in Si-doped GeSbTe for Storage Class Memory.

Giusy Lama, Mathieu Bernard, Nicolas Bernier, Guillaume Bourgeois, Emmanuel Nolot, Niccolo Castellani, Julien Garrione, Marie Claire Cyrille, Gabriele Navarro, Etienne Nowak

Proceedings of the IEEE International Reliability Physics Symposium, 2021

Multilayer OTS Selectors Engineering for High Temperature Stability, Scalability and High Endurance.

Camille Laguna, Mathieu Bernard, Nicolas Bernier, D. Rouchon, N. Rochat, Julien Garrione, A. Jannaud, Emmanuel Nolot, Valentina Meli, Niccolo Castellani, C. Sabbione, Guillaume Bourgeois, Marie Claire Cyrille, Liviu Militaru, A. Souifi, Gabriele Navarro, Etienne Nowak

Proceedings of the IEEE International Memory Workshop, 2021

2018

Carbon electrode for Ge-Se-Sb based OTS selector for ultra low leakage current and outstanding endurance.

Anthonin Verdy, Gabriele Navarro, Mathieu Bernard, Sophie Chevalliez, Niccolo Castellani, Emmanuel Nolot, Julien Garrione, Pierre Noe, Guillaume Bourgeois, Veronique Sousa, Marie Claire Cyrille, Etienne Nowak

Proceedings of the IEEE International Reliability Physics Symposium, 2018