Enrique Dehaerne

According to our database, Enrique Dehaerne authored at least 12 papers between 2020 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2023

A Machine Learning Approach Towards SKILL Code Autocompletion.

Enrique Dehaerne, Bappaditya Dey, Wannes Meert

CoRR, 2023

Benchmarking Feature Extractors for Reinforcement Learning-Based Semiconductor Defect Localization.

Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt

CoRR, 2023

Automated Semiconductor Defect Inspection in Scanning Electron Microscope Images: a Systematic Review.

Thibault Lechien, Enrique Dehaerne, Bappaditya Dey, Víctor Blanco, Sandip Halder, Stefan De Gendt

CoRR, 2023

SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection.

Vic De Ridder, Bappaditya Dey, Enrique Dehaerne, Sandip Halder, Stefan De Gendt, Bartel Van Waeyenberge

CoRR, 2023

YOLOv8 for Defect Inspection of Hexagonal Directed Self-Assembly Patterns: A Data-Centric Approach.

Enrique Dehaerne, Bappaditya Dey, Hossein Esfandiar, Lander Verstraete, Hyo Seon Suh, Sandip Halder, Stefan De Gendt

CoRR, 2023

A Deep Learning Framework for Verilog Autocompletion Towards Design and Verification Automation.

Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt

CoRR, 2023

SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering.

MinJin Hwang, Bappaditya Dey, Enrique Dehaerne, Sandip Halder, Young-han Shin

CoRR, 2023

Optimizing YOLOv7 for Semiconductor Defect Detection.

Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt

CoRR, 2023

2022

Deep Learning based Defect classification and detection in SEM images: A Mask R-CNN approach.

Bappaditya Dey, Enrique Dehaerne, Kasem Khalil, Sandip Halder, Philippe Leray, Magdy A. Bayoumi

CoRR, 2022

Code Generation Using Machine Learning: A Systematic Review.

Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt, Wannes Meert

IEEE Access, 2022

A Comparative Study of Deep-Learning Object Detectors for Semiconductor Defect Detection.

Enrique Dehaerne, Bappaditya Dey, Sandip Halder

Proceedings of the 29th IEEE International Conference on Electronics, Circuits and Systems, 2022

2020

EELWORM: a bioinspired multimodal amphibious soft robot.

Edoardo Milana, Bert Van Raemdonck, Kevin Cornelis, Enrique Dehaerne, Jef De Clerck, Yarno De Groof, Toon De Vil, Benjamin Gorissen, Dominiek Reynaerts

Proceedings of the 3rd IEEE International Conference on Soft Robotics, 2020