Fábio G. R. G. da Silva

According to our database, Fábio G. R. G. da Silva authored at least 9 papers between 2016 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Exploring XOR-based Full Adders and decoupling cells to variability mitigation at FinFET technology.

Fábio G. R. G. da Silva, Rafael N. M. Oliveira, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis

Integr., 2022

Improving Soft Error Robustness of Full Adder Circuits with Decoupling Cell and Transistor Sizing.

Rafael N. M. Oliveira, Fábio G. R. G. da Silva, Ricardo Reis, Rafael B. Schvittz, Cristina Meinhardt

Proceedings of the 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, 2022

2021

SET Mitigation Techniques on Mirror Full Adder at 7 nm FinFET Technology.

Rafael N. M. Oliveira, Fábio G. R. G. da Silva, Ricardo Reis, Cristina Meinhardt

Proceedings of the 22nd IEEE Latin American Test Symposium, 2021

2020

Mitigation Effects of Decoupling Cells on Full Adders Process Variability.

Fabio G. Rossato G. da Silva, Cristina Meinhardt, Ricardo Reis

Proceedings of the 63rd IEEE International Midwest Symposium on Circuits and Systems, 2020

Mirror Full Adder SET Susceptibility on 7nm FinFET Technology.

Rafael N. M. Oliveira, Fábio G. R. G. da Silva, Ricardo Reis, Cristina Meinhardt

Proceedings of the 27th IEEE International Conference on Electronics, Circuits and Systems, 2020

2019

FinFET Variability and Near-threshold operation: Impact on Full Adders design using XOR Blocks.

Fabio G. Rossato G. da Silva, Cristina Meinhardt, Ricardo Augusto da Luz Reis

Proceedings of the 26th IEEE International Conference on Electronics, Circuits and Systems, 2019

2018

Analysis of 6 T SRAM cell in sub-45 nm CMOS and FinFET technologies.

Roberto B. Almeida, Cleiton Magano Marques, Paulo F. Butzen, Fábio G. R. G. da Silva, Ricardo A. L. Reis, Cristina Meinhardt

Microelectron. Reliab., 2018

Impact of Near-Threshold and Variability on 7nm FinFET XOR Circuits.

Fabio G. Rossato G. da Silva, Cristina Meinhardt, Ricardo Reis

Proceedings of the 25th IEEE International Conference on Electronics, Circuits and Systems, 2018

2016

PVT variability analysis of FinFET and CMOS XOR circuits at 16nm.

Fábio G. R. G. da Silva, Paulo F. Butzen, Cristina Meinhardt

Proceedings of the 2016 IEEE International Conference on Electronics, Circuits and Systems, 2016