Farzin Karimi

According to our database, Farzin Karimi authored at least 10 papers between 2001 and 2008.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2008

Applications of decorator and observer design patterns in functional verification.

Farzin Karimi

Proceedings of the IEEE International High Level Design Validation and Test Workshop, 2008

2004

Using data compression in automatic test equipment for system-on-chip testing.

Farzin Karimi, Zainalabedin Navabi, Waleed Meleis, Fabrizio Lombardi

IEEE Trans. Instrum. Meas., 2004

2003

Parallel testing of multi-port static random access memories.

Farzin Karimi, V. Swamy Irrinki, T. Crosby, Nohpill Park, Fabrizio Lombardi

Microelectron. J., 2003

Hybrid Multisite Testing at Manufacturing.

Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi, Farzin Karimi

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Random Testing of Multi-Port Static Random Access Memories.

Farzin Karimi, Fred J. Meyer, Fabrizio Lombardi

Proceedings of the 10th IEEE International Workshop on Memory Technology, 2002

A Scan-Bist Environment for Testing Embedded Memories.

Farzin Karimi, Fabrizio Lombardi

Proceedings of the 10th IEEE International Workshop on Memory Technology, 2002

Data Compression for System-on-Chip Testing Using ATE.

Farzin Karimi, Waleed Meleis, Zainalabedin Navabi, Fabrizio Lombardi

Proceedings of the 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 2002

2001

Fault Detection in a Tristate System Environment.

Wenyi Feng, Farzin Karimi, Fabrizio Lombardi

IEEE Micro, 2001

A Parallel Approach for Testing Multi-Port Static Random Access Memories.

Farzin Karimi, Fabrizio Lombardi, V. Swamy Irrinki, T. Crosby

Proceedings of the 9th IEEE International Workshop on Memory Technology, 2001

Parallel Testing of Multi-port Static Random Access Memories for BIST.

Farzin Karimi, Fabrizio Lombardi

Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001