Giuseppe Garozzo

According to our database, Giuseppe Garozzo authored at least 4 papers between 2022 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

A Comprehensive Scan Test Cost Model to Optimize the Production of Very Large SoCs.

Giusy Iaria, Paolo Bernardi, Claudia Bertani, Lorenzo Cardone, Giuseppe Garozzo, Vincenzo Tancorre

IEEE Trans. Computers, April, 2025

2023

About the Correlation between Logical Identified Faulty Gates and their Layout Characteristics.

Paolo Bernardi, Lorenzo Cardone, Giusy Iaria, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre

Proceedings of the 29th International Symposium on On-Line Testing and Robust System Design, 2023

2022

A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip.

Giusy Iaria, Francesco Angione, Paolo Bernardi, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre

Proceedings of the 23rd IEEE Latin American Test Symposium, 2022

In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip.

Gabriele Filipponi, Giusy Iaria, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre

Proceedings of the IEEE International Test Conference, 2022