Gabriele Filipponi

According to our database, Gabriele Filipponi authored at least 10 papers between 2022 and 2026.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2026

Netlist-Independent Functional Stress Pattern Generation Strategy for AI HW Accelerators Embedded into SoCs.

Gabriele Filipponi, Denis Schwachhofer, Francesco Angione, Claudia Bertani, Simone Corbellini, Nicola Di Gruttola Giardino, Giuseppe Garozzo, Giorgio Insinga, Vincenzo Tancorre, Paolo Bernardi

IEEE Trans. Computers, February, 2026

VTS2026 Contest Publication: TTTC's E.J. McCluskey Best Doctoral Thesis Award.

Luca Benini, Paolo Bernardi, Alberto Bosio, Swarup Bhunia, Riccardo Cantoro, Degang Chen, Krishnendu Chakrabarty, Jayeeta Chaudhuri, Bastien Deveautour, Gabriele Filipponi, Angelo Garofalo, Salvatore Pappalardo, Sudipta Paria, Michael Rogenmoser, Philippe Sauter, Michael Sekyere, Chen Wu

Proceedings of the 44th IEEE VLSI Test Symposium, 2026

2025

A System-Level Test Methodology for Communication Peripherals in System-on-Chips.

Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Gabriele Filipponi, Claudia Bertani, Vincenzo Tancorre

IEEE Trans. Computers, February, 2025

Enhancing Logic Diagnosis of Field Returns Through Logic BIST in Automotive SoCs.

Paolo Bernardi, Gabriele Filipponi, Giusy Iaria, Claudia Bertani, Vincenzo Tancorre

Proceedings of the 26th IEEE Latin American Test Symposium, 2025

FSWGEN: a Device-tree Specification driven System-Level Test workload generator.

Gabriele Filipponi

Proceedings of the IEEE International Test Conference, 2025

2023

Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests.

Paolo Bernardi, Gabriele Filipponi, Tommaso Foscale, Giorgio Insinga

Proceedings of the 24th IEEE Latin American Test Symposium, 2023

Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults.

Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Vincenzo Tancorre

Proceedings of the 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2023

2022

In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip.

Gabriele Filipponi, Giusy Iaria, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre

Proceedings of the IEEE International Test Conference, 2022

An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip.

Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli

Proceedings of the IEEE European Test Symposium, 2022

Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level.

Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Claudia Tempesta, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022