Giyoung Yang
Orcid: 0009-0006-4204-5081
According to our database1,
Giyoung Yang authored at least 4 papers
between 2018 and 2025.
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Bibliography
2025
Chasing Front-End-Of-Line Defects with Cell-Aware Diagnostics in High-Volume Manufacturing.
Proceedings of the IEEE International Test Conference, 2025
2022
Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022
3nm Gate-All-Around (GAA) Design-Technology Co-Optimization (DTCO) for succeeding PPA by Technology.
Proceedings of the IEEE Custom Integrated Circuits Conference, 2022
2018
Proceedings of the International Conference on Computer-Aided Design, 2018