Guilherme Schwanke Cardoso

According to our database, Guilherme Schwanke Cardoso authored at least 8 papers between 2011 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Pseudosymmetric Enclosed Layout Transistors for Radiation Hardened Analog Applications.

Gustavo Paz Platcheck, Guilherme Schwanke Cardoso, Tiago Roberto Balen

IEEE Trans. Aerosp. Electron. Syst., April, 2023

2020

Characterization of Enclosed Layout Transistors for Analog Applications on a130nm Technology.

Gustavo Paz Platcheck, Guilherme Schwanke Cardoso, Tiago R. Balen

Proceedings of the 33rd Symposium on Integrated Circuits and Systems Design, 2020

2017

Single event transient effects on charge redistribution SAR ADCs.

Thales E. Becker, Alisson J. C. Lanot, Guilherme Schwanke Cardoso, Tiago R. Balen

Microelectron. Reliab., 2017

2016

Performance evaluation of radiation hardened analog circuits based on Enclosed Layout geometry.

Guilherme Schwanke Cardoso, Tiago R. Balen

Proceedings of the 17th Latin-American Test Symposium, 2016

Study of layout extraction accuracy on W/L estimation of ELT in analog design flow.

Guilherme Schwanke Cardoso, Tiago R. Balen

Proceedings of the IEEE 7th Latin American Symposium on Circuits & Systems, 2016

2015

Testing fully differential amplifiers using common mode feedback circuit: A case study.

Isis D. Bender, Guilherme Schwanke Cardoso, Arthur C. de Oliveira, Lucas C. Severo, Alessandro Girardi, Tiago R. Balen

Proceedings of the IEEE 6th Latin American Symposium on Circuits & Systems, 2015

2012

Impact of TID-induced threshold deviations in analog building-blocks of operational amplifiers.

Guilherme Schwanke Cardoso, Tiago R. Balen, Marcelo Soares Lubaszewski, Rafael Galhardo Vaz, Odair Lelis Goncalez

Proceedings of the 13th Latin American Test Workshop, 2012

2011

Investigating the effects of transient faults in Programmable Capacitor Arrays.

Tiago R. Balen, Guilherme Schwanke Cardoso, Odair Lelis Gonçalez, Marcelo Soares Lubaszewski

Proceedings of the 12th Latin American Test Workshop, 2011