Rafael Galhardo Vaz

According to our database, Rafael Galhardo Vaz authored at least 7 papers between 2012 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2021

Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs.

Carlos J. González, Bruno L. Costa, Diego N. Machado, Rafael Galhardo Vaz, Alexis C. Vilas Bôas, Odair Lelis Gonçalez, Helmut Puchner, Fernanda Lima Kastensmidt, Nilberto H. Medina, Marcilei Aparecida Guazzelli, Tiago Roberto Balen

J. Electron. Test., 2021

2020

Influence of sampling frequency on TID response of SAR ADCs.

Bruno L. Costa, Carlos J. González, Rafael Galhardo Vaz, Odair Lelis Gonçalez, Tiago R. Balen

Proceedings of the IEEE Latin-American Test Symposium, 2020

2017

Evaluation of a mixed-signal design diversity system under radiation effects.

Carlos J. González, Cristiano P. Chenet, Matheus Budelon, Rafael Galhardo Vaz, Odair Lelis Goncalez, Tiago R. Balen

Proceedings of the 18th IEEE Latin American Test Symposium, 2017

2015

Impact of Total Ionizing Dose on Bulk Built-In Current Sensors with Dynamic Storage Cell.

Alexandre Simionovski, Rafael Galhardo Vaz, Odair Lelis Goncalez, Gilson I. Wirth

J. Electron. Test., 2015

2014

Soft error rate in SRAM-based FPGAs under neutron-induced and TID effects.

Lucas A. Tambara, Jorge L. Tonfat, Ricardo Reis, Fernanda Lima Kastensmidt, Evaldo Carlos Fonseca Pereira, Rafael Galhardo Vaz, Odair Lelis Goncalez

Proceedings of the 15th Latin American Test Workshop, 2014

The effects of total ionizing dose on the neutron SEU cross section of a 130 nm 4 Mb SRAM memory.

Evaldo Carlos Fonseca Pereira, Odair Lelis Goncalez, Rafael Galhardo Vaz, Claudio Antonio Federico, Thiago Hanna Both, Gilson Inácio Wirth

Proceedings of the 15th Latin American Test Workshop, 2014

2012

Impact of TID-induced threshold deviations in analog building-blocks of operational amplifiers.

Guilherme Schwanke Cardoso, Tiago R. Balen, Marcelo Soares Lubaszewski, Rafael Galhardo Vaz, Odair Lelis Goncalez

Proceedings of the 13th Latin American Test Workshop, 2012