Gustavo Aguirre

According to our database, Gustavo Aguirre authored at least 2 papers in 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

A Novel Defect Model Induced by a Single Dust Particle Contamination in the FinFET Gate Fingers.

Gustavo Aguirre, Víctor H. Champac, Freddy Forero, Michel Renovell, Leonardo Miceli

J. Electron. Test., December, 2025

Cost-Effective Analytical Models of Resistive Opens Defects in FinFET Technology.

Gustavo Aguirre, Freddy Forero, Víctor H. Champac, Michel Renovell, Florence Azaïs, Mariane Comte, Jean-Marc Gallière

IEEE Trans. Very Large Scale Integr. Syst., March, 2025