Freddy Forero

According to our database1, Freddy Forero authored at least 9 papers between 2016 and 2019.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2019
Modeling and Detectability of Full Open Gate Defects in FinFET Technology.
IEEE Trans. Very Large Scale Integr. Syst., 2019

A Semi-analytical Model for Interconnect Open Defects in FinFET Logic Cells.
Proceedings of the IEEE Latin American Test Symposium, 2019

B-open: A New Defect in Nanometer Technologies due to SADP Process.
Proceedings of the 24th IEEE European Test Symposium, 2019

2018
Detectability Challenges of Bridge Defects in FinFET Based Logic Cells.
J. Electron. Test., 2018

Robust Detection of Bridge Defects in STT-MRAM Cells Under Process Variations.
Proceedings of the IFIP/IEEE International Conference on Very Large Scale Integration, 2018

Analysis of Bridge Defects in STT-MRAM Cells Under Process Variations and a Robust DFT Technique for Their Detection.
Proceedings of the VLSI-SoC: Design and Engineering of Electronics Systems Based on New Computing Paradigms, 2018

2017
Analysis of short defects in FinFET based logic cells.
Proceedings of the 18th IEEE Latin American Test Symposium, 2017

2016
Improvement of Negative Bias Temperature Instability Circuit Reliability and Power Consumption Using Dual Supply Voltage.
J. Low Power Electron., 2016

A methodology for NBTI circuit reliability at reduced power consumption using dual supply voltage.
Proceedings of the 17th Latin-American Test Symposium, 2016


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