H. Xu
This page is a disambiguation page, it actually contains mutiple papers from persons of the same or a similar name.
Bibliography
2022
A Deeper Understanding of Well Charging Reliability with Circuit Relevant Test Structures.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
Proceedings of the IEEE International Memory Workshop, 2022
2018
Proceedings of the 2018 Annual American Control Conference, 2018
2013
Proceedings of the AFRICON 2013, Pointe aux Piments, Mauritius, September 9-12, 2013, 2013
2012
IET Networks, 2012
2011
Effect of bonding duration and substrate temperature in copper ball bonding on aluminium pads: A TEM study of interfacial evolution.
Microelectron. Reliab., 2011
2010
FEM simulations for reliability assessment of component boards drop tested at various temperatures.
Simul. Model. Pract. Theory, 2010
2000
Int. J. Syst. Sci., 2000
1998