Hsuan-Ling Kao

According to our database, Hsuan-Ling Kao authored at least 16 papers between 2009 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

Effect of body bias and temperature on low-frequency noise in 40-nm nMOSFETs.

Hsien-Chin Chiu, Min-Li Chou, Chun-Hu Cheng, Hsuan-Ling Kao, Cheng-Lin Cho

Microelectron. Reliab., 2017

A high output power and low phase noise GaN HEMT VCO with array of switchable inductors.

Hsuan-Ling Kao, Chih-Sheng Yeh, Hsien-Chin Chiu, Cheng-Lin Cho, Chun-Hu Cheng

Int. J. Circuit Theory Appl., 2017

2016

The ESD protection characteristic and low-frequency noise analysis of GaN Schottky barrier diode with fluorine-based plasma treatment.

Hsien-Chin Chiu, Ji-Fan Chi, Hsuan-Ling Kao, Chia-Yi Chu, Kuan-Liang Cho, Feng-Tso Chien

Microelectron. Reliab., 2016

2013

Low gate interface traps AlGaN/GaN HEMTs using a lattice matched ZrZnO transparent gate design.

Hsien-Chin Chiu, Hsiang-Chun Wang, Chao-Wei Lin, Yi-Cheng Luo, Hsuan-Ling Kao, Feng-Tso Chien, Ping-Kuo Weng, Yan-Tang Gau, Hao-Wei Chuang

Microelectron. Reliab., 2013

Low frequency noise in field-plate multigate AlGaN/GaN single-pole-single-throw RF switches on silicon substrate.

Hsien-Chin Chiu, Chao-Wei Lin, Fan-Hsiu Huang, Hsuan-Ling Kao, Feng-Tso Chien, Hao-Wei Chuang, Kuo-Jen Chang, Yau-Tang Gau

Microelectron. Reliab., 2013

Sidewall defects of AlGaN/GaN HEMTs evaluated by low frequency noise analysis.

Hsien-Chin Chiu, Chao-Hung Chen, Hsuan-Ling Kao, Feng-Tso Chien, Ping-Kuo Weng, Yan-Tang Gau, Hao-Wei Chuang

Microelectron. Reliab., 2013

Design of an S-band 0.35 µm AlGaN/GaN LNA using cascode topology.

Hsuan-Ling Kao, Chih-Sheng Yeh, Cheng-Lin Cho, B. W. Wang, P. C. Lee, B. H. Wei, Hsien-Chin Chiu

Proceedings of the 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2013

2012

Investigation on the thermal behavior of 0.15 μm gate-length In_0.4Al_0.6As/In_0.4Ga_0.6As MHEMT.

Che-Kai Lin, Hsien-Chin Chiu, Chao-Wei Lin, Hsuan-Ling Kao, Feng-Tso Chien

Microelectron. Reliab., 2012

Characterization and reliability of nMOSFETs on flexible substrates under mechanical strain.

Hsuan-Ling Kao, Chih-Sheng Yeh, Meng-Ting Chen, Hsien-Chin Chiu, Li-Chun Chang

Microelectron. Reliab., 2012

A gold-free fully copper metalized AlGaN/GaN power HEMTs on Si substrate.

Hsien-Chin Chiu, Chao-Wei Lin, Hsuan-Ling Kao, Geng-Yen Lee, Jen-Inn Chyi, Hao-Wei Chuang, Kuo-Jen Chang, Yau-Tang Gau

Microelectron. Reliab., 2012

A low phase noise Ka-band voltage controlled oscillator using 0.15 µm GaAs pHEMT technology.

Hsuan-Ling Kao, S. P. Shih, Chih-Sheng Yeh, Li-Chun Chang

Proceedings of the IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2012

2011

Thermal stability investigations of AlGaN/GaN HEMTs with various high work function gate metal designs.

Hsien-Chin Chiu, Chao-Wei Lin, Che-Kai Lin, Hsuan-Ling Kao, Jeffrey S. Fu

Microelectron. Reliab., 2011

A fully on-chip ESD protection UWB-band low noise amplifier using GaAs enhancement-mode dual-gate pHEMT technology.

Hsien-Chin Chiu, Chia-Shih Cheng, Hsuan-Ling Kao, Jeffrey S. Fu, Qiang Cui, Juin J. Liou

Microelectron. Reliab., 2011

A Ka-band triple push coupled pair VCO using 0.18-μm CMOS technology.

Hsuan-Ling Kao, S. P. Shih, Chih-Sheng Yeh, Chia-Ming Yang, C. Y. Ke, Y. C. Lee, Jeffrey S. Fu, Li-Chun Chang

Proceedings of the 8th International Conference on Wireless and Optical Communications Networks, 2011

2010

A low phase noise 20 GHz voltage control oscillator using 0.18-μm CMOS technology.

Chia-Ming Yang, Hsuan-Ling Kao, Y. C. Chang, M. T. Chen, H. M. Chang, C. H. Wu

Proceedings of the 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2010

2009

0.18 µm CMOS UWB LNA with new feedback configuration for optimization low noise, high gain and small area.

Y. C. Chang, Hsuan-Ling Kao, C. H. Kao, C. H. Yang, Jeffrey S. Fu, Nemai C. Karmakar, Li-Chun Chang

Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2009