Huiming Bu

According to our database, Huiming Bu authored at least 2 papers between 2010 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2019

Bias Temperature Instability Reliability in Stacked Gate-All-Around Nanosheet Transistor.

Miaomiao Wang, Jingyun Zhang, Huimei Zhou, Richard G. Southwick, Robin Hsin Kuo Chao, Xin Miao, Veeraraghavan S. Basker, Tenko Yamashita, Dechao Guo, Gauri Karve, Huiming Bu, James H. Stathis

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2010

Fully depleted extremely thin SOI for mainstream 20nm low-power technology and beyond.

Ali Khaki-Firooz, Kangguo Cheng, Basanth Jagannathan, Pranita Kulkarni, Jeffrey W. Sleight, Davood Shahrjerdi, Josephine B. Chang, Sungjae Lee, Junjun Li, Huiming Bu, Robert Gauthier, Bruce Doris, Ghavam G. Shahidi

Proceedings of the IEEE International Solid-State Circuits Conference, 2010