Richard G. Southwick
According to our database1,
Richard G. Southwick
authored at least 11 papers
between 2015 and 2021.
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Bibliography
2021
Proceedings of the IEEE International Reliability Physics Symposium, 2021
Proceedings of the IEEE International Reliability Physics Symposium, 2021
2020
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
Analysis of BTI, SHE Induced BTI and HCD Under Full VG/VD Space in GAA Nano-Sheet N and P FETs.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2019
Bias Temperature Instability Reliability in Stacked Gate-All-Around Nanosheet Transistor.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
On the Frequency Dependence of Bulk Trap Generation During AC Stress in Si and SiGe RMG P-FinFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
Time Dependent Dielectric Breakdown of Cobalt and Ruthenium Interconnects at 36nm Pitch.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
2018
Lateral profiling of HCI induced damage in ultra-scaled FinFET devices with Id-Vd characteristics.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
2017
Proceedings of the 12th IEEE International Conference on ASIC, 2017
Interface engineering of Si1-xGex gate stacks for high performance dual channel CMOS.
Proceedings of the 12th IEEE International Conference on ASIC, 2017
2015
Proceedings of the IEEE International Reliability Physics Symposium, 2015