Junjun Li

According to our database1, Junjun Li authored at least 13 papers between 2006 and 2016.

Collaborative distances :
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2016
Research on the allocation decision of emergency material productivity reserve under the cooperation between the government and the enterprise.
Proceedings of the International Conference on Logistics, Informatics and Service Sciences, 2016

2015
An ant colony algorithm-based fast configuration design method for large container cranes.
IJMR, 2015

2014
EA-COR: An Environment Adaptive Clustering Opportunistic Routing Protocol of WSN.
JNW, 2014

Bundle recommendation in ecommerce.
Proceedings of the 37th International ACM SIGIR Conference on Research and Development in Information Retrieval, 2014

2013
ARX modelling and model predictive control for solid oxide fuel cell.
IJMIC, 2013

2011
Research and Application of gas reservoir modeling.
Proceedings of the Eighth International Conference on Fuzzy Systems and Knowledge Discovery, 2011

2010
Simulation of ESD protection devices in an advanced CMOS technology using a TCAD workbench based on an ESD calibration methodology.
Microelectronics Reliability, 2010

Fully depleted extremely thin SOI for mainstream 20nm low-power technology and beyond.
Proceedings of the IEEE International Solid-State Circuits Conference, 2010

A Blending E-Learning Model for Digital Electronic Technology Teaching.
Proceedings of the International Conference on E-Business and E-Government, 2010

2009
Design optimization of gate-silicided ESD NMOSFETs in a 45 nm bulk CMOS technology.
Microelectronics Reliability, 2009

2007
On Performance of Cooperative Large CDMA Random Access Networks.
Proceedings of the Global Communications Conference, 2007

2006
Compact modeling of on-chip ESD protection devices using Verilog-A.
IEEE Trans. on CAD of Integrated Circuits and Systems, 2006

Analysis of ESD failure mechanism in 65nm bulk CMOS ESD NMOSFETs with ESD implant.
Microelectronics Reliability, 2006


  Loading...