Ian M. Bell

According to our database, Ian M. Bell authored at least 18 papers between 1995 and 2013.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2013

Survey and Evaluation of Automated Model Generation Techniques for High Level Modeling and High Level Fault Modeling.

Likun Xia, Muhammad Umer Farooq, Ian M. Bell, Fawnizu Azmadi Hussin, Aamir Saeed Malik

J. Electron. Test., 2013

2011

Assessment of Microfluidic System Testability using Fault Simulation and Test Metrics.

Thomas O. Myers, Ian M. Bell

J. Electron. Test., 2011

2010

Automated Model Generation Algorithm for High-Level Fault Modeling.

Likun Xia, Ian M. Bell, Antony J. Wilkinson

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010

2008

A novel approach for automated model generation.

Likun Xia, Ian M. Bell, Antony J. Wilkinson

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2008), 2008

2007

Asynchronous arbiter for micro-threaded chip multiprocessors.

Nabil Hasasneh, Ian M. Bell, Chris R. Jesshope

J. Syst. Archit., 2007

The Effectiveness of Test in Controlling Quality Costs: A Conformability Analysis Based Approach.

J. M. Gilbert, Ian M. Bell

J. Electron. Test., 2007

High Level Modelling and Design For a Microthreaded Scheduler to Support Microgrids.

Nabil Hasasneh, Ian M. Bell, Chris R. Jesshope

Proceedings of the 2007 IEEE/ACS International Conference on Computer Systems and Applications (AICCSA 2007), 2007

2006

Supporting Microthread Scheduling and Synchronisation in CMPs.

Ian M. Bell, Nabil Hasasneh, Chris R. Jesshope

Int. J. Parallel Program., 2006

Scalable and Partitionable Asynchronous Arbiter for Micro-threaded Chip Multiprocessors.

Nabil Hasasneh, Ian M. Bell, Chris R. Jesshope

Proceedings of the Architecture of Computing Systems, 2006

2004

Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations.

Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Mark Zwolinski

J. Electron. Test., 2004

2002

Design, Manufacture and Test - Quality Test Estimation.

J. M. Gilbert, Ian M. Bell, D. R. Johnson

Proceedings of the 3rd International Symposium on Quality of Electronic Design, 2002

1998

Evaluation and comparison of structural test methodologies for analogue and mixed signal circuits.

Ian M. Bell, Stephen J. Spinks

Proceedings of the 5th IEEE International Conference on Electronics, Circuits and Systems, 1998

1997

Diagnosis of CMOS op-amps with gate oxide short faults using multilayer perceptrons.

S. Yu, Barrie W. Jervis, Kevin R. Eckersall, Ian M. Bell

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1997

An On-Line Self-Testing Switched-Current Integrator.

Osama K. Abu-Shahla, Ian M. Bell

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

Generation and Verification of Tests for Analogue Circuits Subject to Process Parameter Deviations.

Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Mark Zwolinski

Proceedings of the 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT '97), 1997

1996

Mixed current/voltage observation towards effective testing of analog and mixed-signal circuits.

José Machado da Silva, José Silva Matos, Ian M. Bell, Gaynor E. Taylor

J. Electron. Test., 1996

1995

Concurrent Self Test of Switched Current Circuits Based on the S²I-Technique.

Geir E. Sæther, Chris Toumazou, Gaynor E. Taylor, Kevin R. Eckersall, Ian M. Bell

Proceedings of the 1995 IEEE International Symposium on Circuits and Systems, ISCAS 1995, Seattle, Washington, USA, April 30, 1995

Fault Orientated Test and Fault Simulation of Mixed Signal Integrated Circuits.

Ian M. Bell, Kevin R. Eckersall, Stephen J. Spinks, Gaynor E. Taylor

Proceedings of the 1995 IEEE International Symposium on Circuits and Systems, ISCAS 1995, Seattle, Washington, USA, April 30, 1995