Igor Aleksejev

According to our database, Igor Aleksejev authored at least 11 papers between 2008 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

Run-time reconfigurable instruments for advanced board-level testing.

Igor Aleksejev, Artur Jutman, Sergei Devadze

IEEE Instrum. Meas. Mag., 2017

2016

Optimization of Boundary Scan Tests Using FPGA-Based Efficient Scan Architectures.

Igor Aleksejev, Sergei Devadze, Artur Jutman, Konstantin Shibin

J. Electron. Test., 2016

On coverage of timing related faults at board level.

Artur Jutman, Igor Aleksejev, Sergei Devadze

Proceedings of the 21th IEEE European Test Symposium, 2016

2015

Complex delay fault reasoning with sequential 7-valued algebra.

Jaak Kousaar, Raimund Ubar, Igor Aleksejev

Proceedings of the 16th Latin-American Test Symposium, 2015

Virtual reconfigurable scan-chains on FPGAs for optimized board test.

Igor Aleksejev, Sergei Devadze, Artur Jutman, Konstantin Shibin

Proceedings of the 16th Latin-American Test Symposium, 2015

2012

FPGA-based synthetic instrumentation for board test.

Igor Aleksejev, Artur Jutman, Sergei Devadze, Sergei Odintsov, Thomas Wenzel

Proceedings of the 2012 IEEE International Test Conference, 2012

Embedded synthetic instruments for Board-Level testing.

Artur Jutman, Sergei Devadze, Igor Aleksejev, Thomas Wenzel

Proceedings of the 17th IEEE European Test Symposium, 2012

2011

Invited paper: System-wide fault management based on IEEE P1687 IJTAG.

Artur Jutman, Sergei Devadze, Igor Aleksejev

Proceedings of the 6th International Workshop on Reconfigurable Communication-centric Systems-on-Chip, 2011

2009

Turning JTAG inside out for fast extended test access.

Sergei Devadze, Artur Jutman, Igor Aleksejev, Raimund Ubar

Proceedings of the 10th Latin American Test Workshop, 2009

Fast extended test access via JTAG and FPGAs.

Sergei Devadze, Artur Jutman, Igor Aleksejev, Raimund Ubar

Proceedings of the 2009 IEEE International Test Conference, 2009

2008

Reseeding using compaction of pre-generated LFSR sub-sequences.

Artur Jutman, Igor Aleksejev, Jaan Raik, Raimund Ubar

Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, 2008