Konstantin Shibin

According to our database, Konstantin Shibin authored at least 9 papers between 2013 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

On-Chip Sensors Data Collection and Analysis for SoC Health Management.

Konstantin Shibin, Maksim Jenihhin, Artur Jutman, Sergei Devadze, Anton Tsertov

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023

2017

Health Management for Self-Aware SoCs Based on IEEE 1687 Infrastructure.

Konstantin Shibin, Sergei Devadze, Artur Jutman, Martin Grabmann, Robin Pricken

IEEE Des. Test, 2017

2016

Optimization of Boundary Scan Tests Using FPGA-Based Efficient Scan Architectures.

Igor Aleksejev, Sergei Devadze, Artur Jutman, Konstantin Shibin

J. Electron. Test., 2016

On-line fault classification and handling in IEEE1687 based fault management system for complex SoCs.

Konstantin Shibin, Sergei Devadze, Artur Jutman

Proceedings of the 17th Latin-American Test Symposium, 2016

Designing reliable cyber-physical systems overview associated to the special session at FDL'16.

Gadi Aleksandrowicz, Eli Arbel, Roderick Bloem, Timon D. ter Braak, Sergei Devadze, Görschwin Fey, Maksim Jenihhin, Artur Jutman, Hans G. Kerkhoff, Robert Könighofer, Jan Malburg, Shiri Moran, Jaan Raik, Gerard K. Rauwerda, Heinz Riener, Franz Röck, Konstantin Shibin, Kim Sunesen, Jinbo Wan, Yong Zhao

Proceedings of the 2016 Forum on Specification and Design Languages, 2016

2015

Virtual reconfigurable scan-chains on FPGAs for optimized board test.

Igor Aleksejev, Sergei Devadze, Artur Jutman, Konstantin Shibin

Proceedings of the 16th Latin-American Test Symposium, 2015

At-Speed Testing of Inter-Die Connections of 3D-SICs in the Presence of Shore Logic.

Konstantin Shibin, Vivek Chickermane, Brion L. Keller, Christos Papameletis, Erik Jan Marinissen

Proceedings of the 24th IEEE Asian Test Symposium, 2015

2014

Asynchronous Fault Detection in IEEE P1687 Instrument Network.

Konstantin Shibin, Sergei Devadze, Artur Jutman

Proceedings of the IEEE 23rd North Atlantic Test Workshop, 2014

2013

Effective Scalable IEEE 1687 Instrumentation Network for Fault Management.

Artur Jutman, Sergei Devadze, Konstantin Shibin

IEEE Des. Test, 2013