Ismed Hartanto

According to our database, Ismed Hartanto authored at least 14 papers between 1995 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

Cell-Aware ATPG to Improve Defect Coverage for FPGA IPs and Next Generation Zynq® MPSoCs.

Seetal Potluri, Aaron Mathew, Rambabu Nerukonda, Ismed Hartanto, Shahin Toutounchi

Proceedings of the 26th IEEE Asian Test Symposium, 2017

2007

Using FPGA configuration memory to accelerate yield learning for advanced process.

Jenny Fan, Xiao-Yu Li, Ismed Hartanto

Proceedings of the 16th Asian Test Symposium, 2007

2002

Multiplets, Models, and the Search for Meaning: Improving Per-Test Fault Diagnosis.

David B. Lavo, Ismed Hartanto, Tracy Larrabee

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Diagnostic simulation of stuck-at faults in sequential circuits using compact lists.

Ismed Hartanto, Srikanth Venkataraman, W. Kent Fuchs, Elizabeth M. Rudnick, Janak H. Patel, Sreejit Chakravarty

ACM Trans. Design Autom. Electr. Syst., 2001

2000

Comparing functional and structural tests.

Peter C. Maxwell, Ismed Hartanto, Lee Bentz

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1998

Probabilistic mixed-model fault diagnosis.

David B. Lavo, Brian Chess, Tracy Larrabee, Ismed Hartanto

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997

Diagnostic Test Pattern Generation for Sequential Circuits.

Ismed Hartanto, Vamsi Boppana, Janak H. Patel, W. Kent Fuchs

Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997

Characterization and Implicit Identification of Sequential Indistinguishability.

Vamsi Boppana, Ismed Hartanto, W. Kent Fuchs

Proceedings of the 10th International Conference on VLSI Design (VLSI Design 1997), 1997

1996

Dynamic diagnosis of sequential circuits based on stuck-at faults.

Srikanth Venkataraman, Ismed Hartanto, W. Kent Fuchs

Proceedings of the 14th IEEE VLSI Test Symposium (VTS'96), April 28, 1996

Full fault dictionary storage based on labeled tree encoding.

Vamsi Boppana, Ismed Hartanto, W. Kent Fuchs

Proceedings of the 14th IEEE VLSI Test Symposium (VTS'96), April 28, 1996

Diagnostic Fault Equivalence Identification Using Redundancy Information and Structural Analysis.

Ismed Hartanto, Vamsi Boppana, W. Kent Fuchs

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

Identification of unsettable flip-flops for partial scan and faster ATPG.

Ismed Hartanto, Vamsi Boppana, W. Kent Fuchs

Proceedings of the 1996 IEEE/ACM International Conference on Computer-Aided Design, 1996

Fault Diagnosis Using State Information.

Vamsi Boppana, Ismed Hartanto, W. Kent Fuchs

Proceedings of the Digest of Papers: FTCS-26, 1996

1995

Rapid Diagnostic Fault Simulation of Stuck-at Faults in Sequential Circuits Using Compact Lists.

Srikanth Venkataraman, Ismed Hartanto, W. Kent Fuchs, Elizabeth M. Rudnick, Sreejit Chakravarty, Janak H. Patel

Proceedings of the 32st Conference on Design Automation, 1995