J. Braden

According to our database1, J. Braden authored at least 2 papers between 1996 and 1997.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

1997
Power Dissipation During Testing: Should We Worry About it?
Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997

1996
Board-Level BIST.
Proceedings of the 14th IEEE VLSI Test Symposium (VTS'96), April 28, 1996


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