Jaap Bisschop

According to our database1, Jaap Bisschop authored at least 5 papers between 2002 and 2010.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book  In proceedings  Article  PhD thesis  Dataset  Other 

Links

On csauthors.net:

Bibliography

2010
Determination of the stress level for voltage screen of integrated circuits.
Microelectron. Reliab., 2010

2008
Editorial.
Microelectron. Reliab., 2008

2007
Reliability methods and standards.
Microelectron. Reliab., 2007

2004
Integrated thermo-mechanical design and qualification of wafer backend structures.
Microelectron. Reliab., 2004

2002
Fast temperature cycling and electromigration induced thin film cracking in multilevel interconnection: experiments and modeling.
Microelectron. Reliab., 2002


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