Jack Strand

Orcid: 0000-0002-4603-6151

According to our database1, Jack Strand authored at least 4 papers between 2018 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

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Links

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Bibliography

2023
Towards a Universal Model of Dielectric Breakdown.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022
Variability and disturb sources in ferroelectric 3D NANDs and comparison to Charge-Trap equivalents.
Proceedings of the IEEE International Memory Workshop, 2022

2021
Variability sources and reliability of 3D - FeFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2021

2018
Role of electron and hole trapping in the degradation and breakdown of SiO2 and HfO2 films.
Proceedings of the IEEE International Reliability Physics Symposium, 2018


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