Jason G. Brown

According to our database, Jason G. Brown authored at least 9 papers between 2004 and 2008.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2008

Automated Standard Cell Library Analysis for Improved Defect Modeling.

Jason G. Brown, R. D. (Shawn) Blanton

Proceedings of the 9th International Symposium on Quality of Electronic Design (ISQED 2008), 2008

Automated Testability Enhancements for Logic Brick Libraries.

Jason G. Brown, Brian Taylor, Ronald D. Blanton, Larry T. Pileggi

Proceedings of the Design, Automation and Test in Europe, 2008

2007

A Built-in Self-test and Diagnosis Strategy for Chemically Assembled Electronic Nanotechnology.

Jason G. Brown, R. D. (Shawn) Blanton

J. Electron. Test., 2007

2006

Extracting Defect Density and Size Distributions from Product ICs.

Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer

IEEE Des. Test Comput., 2006

Exploiting Regularity for Inductive Fault Analysis.

Jason G. Brown, R. D. (Shawn) Blanton

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Extraction of defect density and size distributions from wafer sort test results.

Jeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jason G. Brown, N. Patil, Wojciech Maly, R. D. (Shawn) Blanton

Proceedings of the Conference on Design, Automation and Test in Europe, 2006

Multiple-detect ATPG based on physical neighborhoods.

Jeffrey E. Nelson, Jason G. Brown, Rao Desineni, R. D. (Shawn) Blanton

Proceedings of the 43rd Design Automation Conference, 2006

2004

Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations.

Thomas J. Vogels, Thomas Zanon, Rao Desineni, R. D. (Shawn) Blanton, Wojciech Maly, Jason G. Brown, Jeffrey E. Nelson, Y. Fei, X. Huang, Padmini Gopalakrishnan, Mahim Mishra, Vyacheslav Rovner, S. Tiwary

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

CAEN-BIST: Testing the NanoFabric.

Jason G. Brown, R. D. (Shawn) Blanton

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004