Thomas Zanon

According to our database, Thomas Zanon authored at least 7 papers between 2003 and 2009.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2009

STDF Memory Fail Datalog Standard.

Ajay Khoche, Jay Katz, Sauro Landini, Kochen Liao, Neetu Agrawal, Glenn Plowman, Songlin Zuo, Liyang Lai, John Rowe, Thomas Zanon

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

2007

Raman-Ramsey Interaction for Coherent Population Trapping Cs Clock.

Stéphane Guérandel, Thomas Zanon, N. Castagna, F. Dahes, Emeric de Clercq, Noël Dimarcq, André Clairon

IEEE Trans. Instrum. Meas., 2007

2006

Extracting Defect Density and Size Distributions from Product ICs.

Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer

IEEE Des. Test Comput., 2006

Extraction of defect density and size distributions from wafer sort test results.

Jeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jason G. Brown, N. Patil, Wojciech Maly, R. D. (Shawn) Blanton

Proceedings of the Conference on Design, Automation and Test in Europe, 2006

2005

Observation of Raman-Ramsey fringes with optical CPT pulses.

Thomas Zanon, Stéphane Tremine, Stéphane Guérandel, Emeric de Clercq, David Holleville, Noël Dimarcq, André Clairon

IEEE Trans. Instrum. Meas., 2005

2004

Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations.

Thomas J. Vogels, Thomas Zanon, Rao Desineni, R. D. (Shawn) Blanton, Wojciech Maly, Jason G. Brown, Jeffrey E. Nelson, Y. Fei, X. Huang, Padmini Gopalakrishnan, Mahim Mishra, Vyacheslav Rovner, S. Tiwary

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

Deformations of IC Structure in Test and Yield Learning.

Wojciech Maly, Anne E. Gattiker, Thomas Zanon, Thomas J. Vogels, R. D. (Shawn) Blanton, Thomas M. Storey

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003