Brady Benware

According to our database, Brady Benware authored at least 35 papers between 2003 and 2018.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2018

Improving the Resolution of Multiple Defect Diagnosis by Removing and Selecting Tests.

Naixing Wang, Irith Pomeranz, Brady Benware, M. Enamul Amyeen, Srikanth Venkataraman

Proceedings of the 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2018

2017

Scan Chain Diagnosis Based on Unsupervised Machine Learning.

Yu Huang, Brady Benware, Randy Klingenberg, Huaxing Tang, Jayant Dsouza, Wu-Tung Cheng

Proceedings of the 26th IEEE Asian Test Symposium, 2017

Automatic Identification of Yield Limiting Layout Patterns Using Root Cause Deconvolution on Volume Scan Diagnosis Data.

Wu-Tung Cheng, Randy Klingenberg, Brady Benware, Wu Yang, Manish Sharma, Geir Eide, Yue Tian, Sudhakar M. Reddy, Yan Pan, Sherwin Fernandes, Atul Chittora

Proceedings of the 26th IEEE Asian Test Symposium, 2017

2015

Diagnosing timing related cell internal defects for FinFET technology.

Huaxing Tang, Ting-Pu Tai, Wu-Tung Cheng, Brady Benware, Friedrich Hapke

Proceedings of the VLSI Design, Automation and Test, 2015

2014

Innovative practices session 2C: Advanced in yield learning.

Yen-Tzu Lin, Brady Benware, Brian Stine, Azeez Bhavnagarwala

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models.

Huaxing Tang, Brady Benware, Michael Reese, Joseph Caroselli, Thomas Herrmann, Friedrich Hapke, Robert Tao, Wu-Tung Cheng, Manish Sharma

Proceedings of the 23rd IEEE Asian Test Symposium, 2014

2013

Distributed dynamic partitioning based diagnosis of scan chain.

Yu Huang, Xiaoxin Fan, Huaxing Tang, Manish Sharma, Wu-Tung Cheng, Brady Benware, Sudhakar M. Reddy

Proceedings of the 31st IEEE VLSI Test Symposium, 2013

2012

Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results.

Brady Benware, Chris Schuermyer, Manish Sharma, Thomas Herrmann

IEEE Des. Test Comput., 2012

Improved volume diagnosis throughput using dynamic design partitioning.

Xiaoxin Fan, Huaxing Tang, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Brady Benware

Proceedings of the 2012 IEEE International Test Conference, 2012

2011

Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs.

Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer

J. Electron. Test., 2011

A novel Test Access Mechanism for failure diagnosis of multiple isolated identical cores.

Manish Sharma, Avijit Dutta, Wu-Tung Cheng, Brady Benware, Mark Kassab

Proceedings of the 2011 IEEE International Test Conference, 2011

On Using Design Partitioning to Reduce Diagnosis Memory Footprint.

Xiaoxin Fan, Huaxing Tang, Sudhakar M. Reddy, Wu-Tung Cheng, Brady Benware

Proceedings of the 20th IEEE Asian Test Symposium, 2011

2010

Determination of Dominant-Yield-Loss Mechanism with Volume Diagnosis.

Manish Sharma, Chris Schuermyer, Brady Benware

IEEE Des. Test Comput., 2010

Case study of scan chain diagnosis and PFA on a low yield wafer.

Yu Huang, Brady Benware, Wu-Tung Cheng, Ting-Pu Tai, Feng-Ming Kuo, Yuan-Shih Chen

Proceedings of the 2011 IEEE International Test Conference, 2010

Diagnosis of failing scan cells through orthogonal response compaction.

Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer

Proceedings of the 15th European Test Symposium, 2010

2009

Bridging DFM Analysis and Volume Diagnostics for Yield Learning - A Case Study.

Ritesh P. Turakhia, Mark Ward, Sandeep Kumar Goel, Brady Benware

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

2008

Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data.

Manish Sharma, Brady Benware, Lei Ling, David Abercrombie, Lincoln Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Reinhart Lin, Albert Mann

Proceedings of the 2008 IEEE International Test Conference, 2008

Enhancing Transition Fault Model for Delay Defect Diagnosis.

Wu-Tung Cheng, Brady Benware, Ruifeng Guo, Kun-Han Tsai, Takeo Kobayashi, Kazuyuki Maruo, Michinobu Nakao, Yoshiaki Fukui, Hideyuki Otake

Proceedings of the 17th IEEE Asian Test Symposium, 2008

2007

Silicon Evaluation of Static Alternative Fault Models.

Chris Schuermyer, Jewel Pangilinan, Jay Jahangiri, Martin Keim, Janusz Rajski, Brady Benware

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement.

Huaxing Tang, Manish Sharma, Janusz Rajski, Martin Keim, Brady Benware

Proceedings of the 12th European Test Symposium, 2007

2006

Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers.

Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware

IEEE Des. Test Comput., 2006

Extracting Defect Density and Size Distributions from Product ICs.

Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer

IEEE Des. Test Comput., 2006

A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis.

Martin Keim, Nagesh Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware

Proceedings of the 2006 IEEE International Test Conference, 2006

2005

Defect Screening Using Independent Component Analysis on I_DDQ.

Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon, W. Robert Daasch

Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005

Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis.

Chris Schuermyer, Kevin Cota, Robert Madge, Brady Benware

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

The value of statistical testing for quality, yield and test cost improvement.

Robert Madge, Brady Benware, Mark Ward, W. Robert Daasch

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

Case study: effectiveness of high-speed scan based feed forward voltage testing in reducing DPPM on a high volume ASIC.

Joel Lurkins, DeAnna Hill, Brady Benware

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

Detection of Temperature Sensitive Defects Using ZTC.

Ethan Long, W. Robert Daasch, Robert Madge, Brady Benware

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost.

Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model.

Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Achieving Sub 100 DPPM Defect Levels on VDSM and Nanometer ASICs.

Brady Benware

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs.

Robert Madge, Brady Benware, W. Robert Daasch

IEEE Des. Test Comput., 2003

Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs.

Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch

Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003

Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ.

Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

Impact of Multiple-Detect Test Patterns on Product Quality.

Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003