Jeanne Bickford

According to our database1, Jeanne Bickford authored at least 3 papers between 2006 and 2010.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2010
Use of scalable Parametric Measurement Macro to improve semiconductor technology characterization and product test.
Proceedings of the 11th International Symposium on Quality of Electronic Design (ISQED 2010), 2010

2006
Yield Improvement by Local Wiring Redundancy.
Proceedings of the 7th International Symposium on Quality of Electronic Design (ISQED 2006), 2006

DFM/DFY design for manufacturability and yield - influence of process variations in digital, analog and mixed-signal circuit design.
Proceedings of the Conference on Design, Automation and Test in Europe, 2006


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