Rouwaida Kanj

According to our database, Rouwaida Kanj authored at least 71 papers between 2002 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2023

A Best Balance Ratio Ordered Feature Selection Methodology for Robust and Fast Statistical Analysis of Memory Designs.

Lama Shaer, Rouwaida Kanj, Rajiv V. Joshi

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., June, 2023

A Portable Non-Invasive Electromagnetic Lesion-Optimized Sensing Device for the Diagnosis of Skin Cancer (SkanMD).

Nader Shafi, Joseph Costantine, Rouwaida Kanj, Youssef Tawk, Ali Ramadan, Mazen Kurban, Jihane Abou Rahal, Assaad A. Eid

IEEE Trans. Biomed. Circuits Syst., June, 2023

DT2CAM: A Decision Tree to Content Addressable Memory Framework.

Mariam Rakka, Mohammed E. Fouda, Rouwaida Kanj, Fadi J. Kurdahi

IEEE Trans. Emerg. Top. Comput., 2023

AudioFool: Fast, Universal and synchronization-free Cross-Domain Attack on Speech Recognition.

Mohamad Fakih, Rouwaida Kanj, Fadi J. Kurdahi, Mohammed E. Fouda

CoRR, 2023

Hardware Implementation and Evaluation of an Information Processing Factory.

Walaa Amer, Mariam Rakka, Rachid Karami, Minjun Seo, Mazen A. R. Saghir, Rouwaida Kanj, Fadi J. Kurdahi

Proceedings of the 31st IFIP/IEEE International Conference on Very Large Scale Integration, 2023

Scalable Complementary FeFET CAM Design.

Omar Bekdache, Hadi Noureddine, Mohamad Al Tawil, Rouwaida Kanj, Mohamed E. Fouda, Ahmed M. Eltawil

Proceedings of the IEEE International Symposium on Circuits and Systems, 2023

Hardware Acceleration of DNA Pattern Matching with Binary Memristors.

Jinane Bazzi, Mohammed E. Fouda, Rouwaida Kanj, Ahmed M. Eltawil

Proceedings of the IEEE International Symposium on Circuits and Systems, 2023

High-Density FeFET-based CAM Cell Design Via Multi-Dimensional Encoding.

Hadi Noureddine, Omar Bekdache, Mohamad Al Tawil, Rouwaida Kanj, Ali Chehab, Mohammed E. Fouda, Ahmed M. Eltawil

Proceedings of the Great Lakes Symposium on VLSI 2023, 2023

2022

Group LARS-Based Iterative Reweighted Least Squares Methodology for Efficient Statistical Modeling of Memory Designs.

Lama Shaer, Rouwaida Kanj, Rajiv V. Joshi, Ali Chehab

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

DNA Pattern Matching Acceleration with Analog Resistive CAM.

Jinane Bazzi, Jana Sweidan, Mohammed E. Fouda, Rouwaida Kanj, Ahmed M. Eltawil

CoRR, 2022

Efficient Analog CAM Design.

Jinane Bazzi, Jana Sweidan, Mohammed E. Fouda, Rouwaida Kanj, Ahmed M. Eltawil

CoRR, 2022

1T1R In-Memory Compute for Winner Takes All Application in Kohonen Neural Networks.

Aya Mouallem, Hussein Fadlallah, Lina Bacha, Dana El Hajj, Rachid Jamil, Dana Bazazo, Rouwaida Kanj

Proceedings of the IEEE International Symposium on Circuits and Systems, 2022

2021

Secure MIMO D2D communication based on a lightweight and robust PLS cipher scheme.

Hassan N. Noura, Reem Melki, Rouwaida Kanj, Ali Chehab

Wirel. Networks, 2021

Design Exploration of Sensing Techniques in 2T-2R Resistive Ternary CAMs.

Mariam Rakka, Mohamed E. Fouda, Rouwaida Kanj, Ahmed M. Eltawil, Fadi J. Kurdahi

IEEE Trans. Circuits Syst. II Express Briefs, 2021

In-memory Multi-valued Associative Processor.

Mira Hout, Mohammed E. Fouda, Rouwaida Kanj, Ahmed M. Eltawil

CoRR, 2021

Efficient Noise Mitigation Technique for Quantum Computing.

Ali Shaib, Mohamad H. Naim, Mohammed E. Fouda, Rouwaida Kanj, Fadi J. Kurdahi

CoRR, 2021

Importance Splitting Sample Point Reuse for Efficient Memory Yield Estimation.

Mariam Rakka, Rouwaida Kanj

Proceedings of the IEEE International Symposium on Circuits and Systems, 2021

2020

Hybrid Importance Splitting Importance Sampling Methodology for Fast Yield Analysis of Memory Designs.

Mariam Rakka, Rouwaida Kanj, Ragheb Raad

Proceedings of the IEEE International Symposium on Circuits and Systems, 2020

Threshold Switch Modeling for Analog CAM Design.

Jinane Bazzi, Mohammed E. Fouda, Rouwaida Kanj, Ahmed M. Eltawil

Proceedings of the 32nd International Conference on Microelectronics, 2020

2019

Verification at RTL Using Separation of Design Concerns.

Maya H. Safieddine, Fadi A. Zaraket, Rouwaida Kanj, Ali S. Elzein, Wolfgang Roesner

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019

Data Imbalance Handling Approaches for Accurate Statistical Modeling and Yield Analysis of Memory Designs.

Lama Shaer, Rouwaida Kanj, Rajiv V. Joshi

Proceedings of the IEEE International Symposium on Circuits and Systems, 2019

RRAM Endurance and Retention: Challenges, Opportunities and Implications on Reliable Design.

Zainab Swaidan, Rouwaida Kanj, Johnny El Hajj, Edward Saad, Fadi J. Kurdahi

Proceedings of the 26th IEEE International Conference on Electronics, Circuits and Systems, 2019

2018

Sparse Regression Driven Mixture Importance Sampling for Memory Design.

Maria Malik, Rajiv V. Joshi, Rouwaida Kanj, Shupeng Sun, Houman Homayoun, Tong Li

IEEE Trans. Very Large Scale Integr. Syst., 2018

Identity Based Key Distribution Framework for Link Layer Security of AMI Networks.

Vahe Seferian, Rouwaida Kanj, Ali Chehab, Ayman I. Kayssi

IEEE Trans. Smart Grid, 2018

Double error cellular automata-based error correction with skip-mode compact syndrome coding for resilient PUF design.

Anthony Mattar El Raachini, Hussein Alawieh, Adam Issa, Zainab Swaidan, Rouwaida Kanj, Ali Chehab, Mazen A. R. Saghir

Proceedings of the 19th International Symposium on Quality Electronic Design, 2018

Low power GDI ALU design with mixed logic adder functionality.

Jean Abou Rahal, Bassel Maamari, Basma Hajri, Rouwaida Kanj, Mohammad M. Mansour, Ali Chehab

Proceedings of the 2018 International Conference on IC Design & Technology, 2018

2017

Regularized logistic regression for fast importance sampling based SRAM yield analysis.

Lama Shaer, Rouwaida Kanj, Rajiv V. Joshi, Maria Malik, Ali Chehab

Proceedings of the 18th International Symposium on Quality Electronic Design, 2017

Yield and energy tradeoffs of an NVLatch design using radial sampling.

Adam Issa, Rouwaida Kanj, Ali Chehab, Rajiv V. Joshi

Proceedings of the 2017 IEEE International Conference on IC Design and Technology, 2017

2016

A Universal Hardware-Driven PVT and Layout-Aware Predictive Failure Analytics for SRAM.

Rajiv V. Joshi, Sudesh Saroop, Rouwaida Kanj, Yang Liu, Weike Wang, Carl Radens, Yue Tan, Karthik Yogendra

IEEE Trans. Very Large Scale Integr. Syst., 2016

Bayesian Model Fusion: Large-Scale Performance Modeling of Analog and Mixed-Signal Circuits by Reusing Early-Stage Data.

Fa Wang, Paolo Cachecho, Wangyang Zhang, Shupeng Sun, Xin Li, Rouwaida Kanj, Chenjie Gu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016

Automated FPGA implementations of BIP designs.

Maya H. Safieddine, Fadi A. Zaraket, Mohamad Jaber, Rouwaida Kanj, Mazen A. R. Saghir

Proceedings of the 11th IEEE Symposium on Industrial Embedded Systems, 2016

Efficient analog circuit optimization using sparse regression and error margining.

Mohamed Baker Alawieh, Fa Wang, Rouwaida Kanj, Xin Li, Rajiv V. Joshi

Proceedings of the 17th International Symposium on Quality Electronic Design, 2016

2015

Super Fast Physics-Based Methodology for Accurate Memory Yield Prediction.

Rajiv V. Joshi, Keunwoo Kim, Rouwaida Kanj, Ajay N. Bhoj, Matthew M. Ziegler, Phil Oldiges, Pranita Kerber, Robert Wong, Terence Hook, Sudesh Saroop, Carl Radens, Chun-Chen Yeh

IEEE Trans. Very Large Scale Integr. Syst., 2015

Corrections to "Super Fast Physics-Based Methodology for Accurate Memory Yield Prediction".

Rajiv V. Joshi, Rouwaida Kanj

IEEE Trans. Very Large Scale Integr. Syst., 2015

Separation of concerns for hardware components of embedded systems in BIP.

Maya H. Safieddine, Rouwaida Kanj, Fadi A. Zaraket, Ali S. Elzein, Mohamad Jaber

Proceedings of the Sixteenth International Symposium on Quality Electronic Design, 2015

2014

PUF and ID-based key distribution security framework for advanced metering infrastructures.

Vahe Seferian, Rouwaida Kanj, Ali Chehab, Ayman I. Kayssi

Proceedings of the 2014 IEEE International Conference on Smart Grid Communications, 2014

Impact of FinFET technology for power gating in nano-scale design.

Keunwoo Kim, Rouwaida Kanj, Rajiv V. Joshi

Proceedings of the Fifteenth International Symposium on Quality Electronic Design, 2014

Statistical methodology for modeling non-IID memory fails events.

Sabine Francis, Rouwaida Kanj, Rajiv V. Joshi, Ayman I. Kayssi, Ali Chehab

Proceedings of the Fifteenth International Symposium on Quality Electronic Design, 2014

Robust bias temperature instability refresh design and methodology for memory cell recovery.

Gerard Touma, Rouwaida Kanj, Rajiv V. Joshi, Ayman I. Kayssi, Ali Chehab

Proceedings of the 2014 IEEE International Conference on IC Design & Technology, 2014

2013

Hardware-corroborated Variability-Aware SRAM Methodology.

Rajiv V. Joshi, Rouwaida Kanj, S. Butt, Emrah Acar, D. Lea, D. Sciacca

Proceedings of the 26th International Conference on VLSI Design and 12th International Conference on Embedded Systems, 2013

Low Cost Arduino/Android-Based Energy-Efficient Home Automation System with Smart Task Scheduling.

Kim Baraka, Marc Ghobril, Sami Malek, Rouwaida Kanj, Ayman I. Kayssi

Proceedings of the Fifth International Conference on Computational Intelligence, 2013

2012

Isolated Preset Architecture for a 32nm SOI embedded DRAM macro.

John Barth, Don Plass, Adis Vehabovic, Rajiv V. Joshi, Rouwaida Kanj, Steven Burns, Todd Weaver

Proceedings of the Symposium on VLSI Circuits, 2012

A novel sample reuse methodology for fast statistical simulations with applications to manufacturing variability.

Rouwaida Kanj, Rajiv V. Joshi

Proceedings of the Thirteenth International Symposium on Quality Electronic Design, 2012

A thermal and process variation aware MTJ switching model and its applications in soft error analysis.

Peiyuan Wang, Wei Zhang, Rajiv V. Joshi, Rouwaida Kanj, Yiran Chen

Proceedings of the 2012 IEEE/ACM International Conference on Computer-Aided Design, 2012

Yield estimation via multi-cones.

Rouwaida Kanj, Rajiv V. Joshi, Zhuo Li, Jerry Hayes, Sani R. Nassif

Proceedings of the 49th Annual Design Automation Conference 2012, 2012

2011

The Impact of Statistical Leakage Models on Design Yield Estimation.

Rouwaida Kanj, Rajiv V. Joshi, Sani R. Nassif

VLSI Design, 2011

A Novel Column-Decoupled 8T Cell for Low-Power Differential and Domino-Based SRAM Design.

Rajiv V. Joshi, Rouwaida Kanj, Vinod Ramadurai

IEEE Trans. Very Large Scale Integr. Syst., 2011

Accelerated statistical simulation via on-demand Hermite spline interpolations.

Rouwaida Kanj, Tong Li, Rajiv V. Joshi, Kanak Agarwal, Ali Sadigh, David Winston, Sani R. Nassif

Proceedings of the 2011 IEEE/ACM International Conference on Computer-Aided Design, 2011

Universal statistical cure for predicting memory loss.

Rajiv V. Joshi, Rouwaida Kanj, Peiyuan Wang, Hai Li

Proceedings of the 2011 IEEE/ACM International Conference on Computer-Aided Design, 2011

2010

The Dawn of Predictive Chip Yield Design: Along and Beyond the Memory Lane.

Rajiv V. Joshi, Rouwaida Kanj, Anthony Pelella, Arthur Tuminaro, Yuen H. Chan

IEEE Des. Test Comput., 2010

FinFET SRAM Design.

Rajiv V. Joshi, Keunwoo Kim, Rouwaida Kanj

Proceedings of the VLSI Design 2010: 23rd International Conference on VLSI Design, 2010

Use of scalable Parametric Measurement Macro to improve semiconductor technology characterization and product test.

Jeanne Bickford, Nazmul Habib, John Goss, Robert McMahon, Rajiv V. Joshi, Rouwaida Kanj

Proceedings of the 11th International Symposium on Quality of Electronic Design (ISQED 2010), 2010

Statistical leakage modeling for accurate yield analysis: the CDF matching method and its alternatives.

Rouwaida Kanj, Rajiv V. Joshi, Sani R. Nassif

Proceedings of the 2010 International Symposium on Low Power Electronics and Design, 2010

2009

The impact of BEOL lithography effects on the SRAM cell performance and yield.

Nancy Ying Zhou, Rouwaida Kanj, Kanak Agarwal, Zhuo Li, Rajiv V. Joshi, Sani R. Nassif, Weiping Shi

Proceedings of the 10th International Symposium on Quality of Electronic Design (ISQED 2009), 2009

Statistical yield analysis of silicon-on-insulator embedded DRAM.

Rouwaida Kanj, Rajiv V. Joshi, Jente B. Kuang, J. Kim, Mesut Meterelliyoz, William R. Reohr, Sani R. Nassif, Kevin J. Nowka

Proceedings of the 10th International Symposium on Quality of Electronic Design (ISQED 2009), 2009

An elegant hardware-corroborated statistical repair and test methodology for conquering aging effects.

Rouwaida Kanj, Rajiv V. Joshi, Chad Adams, James D. Warnock, Sani R. Nassif

Proceedings of the 2009 International Conference on Computer-Aided Design, 2009

Yield estimation of SRAM circuits using "Virtual SRAM Fab".

Aditya Bansal, Rama N. Singh, Rouwaida Kanj, Saibal Mukhopadhyay, Jin-Fuw Lee, Emrah Acar, Amith Singhee, Keunwoo Kim, Ching-Te Chuang, Sani R. Nassif, Fook-Luen Heng, Koushik K. Das

Proceedings of the 2009 International Conference on Computer-Aided Design, 2009

2008

A Root-Finding Method for Assessing SRAM Stability.

Rouwaida Kanj, Zhuo Li, Rajiv V. Joshi, Frank Liu, Sani R. Nassif

Proceedings of the 9th International Symposium on Quality of Electronic Design (ISQED 2008), 2008

Statistical Evaluation of Split Gate Opportunities for Improved 8T/6T Column-Decoupled SRAM Cell Yield.

Rouwaida Kanj, Rajiv V. Joshi, Keunwoo Kim, Richard Williams, Sani R. Nassif

Proceedings of the 9th International Symposium on Quality of Electronic Design (ISQED 2008), 2008

SRAM methodology for yield and power efficiency: per-element selectable supplies and memory reconfiguration schemes.

Rouwaida Kanj, Rajiv V. Joshi, Zhuo Li, Jente B. Kuang, Hung C. Ngo, Nancy Ying Zhou, Weiping Shi, Sani R. Nassif

Proceedings of the 2008 International Symposium on Low Power Electronics and Design, 2008

2007

Gate Leakage Effects on Yield and Design Considerations of PD/SOI SRAM Designs.

Rouwaida Kanj, Rajiv V. Joshi, Jayakumaran Sivagnaname, Jente B. Kuang, Dhruva Acharyya, Tuyet Nguyen, Chandler McDowell, Sani R. Nassif

Proceedings of the 8th International Symposium on Quality of Electronic Design (ISQED 2007), 2007

Cross Layer Error Exploitation for Aggressive Voltage Scaling.

Amin Khajeh Djahromi, Ahmed M. Eltawil, Fadi J. Kurdahi, Rouwaida Kanj

Proceedings of the 8th International Symposium on Quality of Electronic Design (ISQED 2007), 2007

A floating-body dynamic supply boosting technique for low-voltage sram in nanoscale PD/SOI CMOS technologies.

Rajiv V. Joshi, Rouwaida Kanj, Keunwoo Kim, Richard Q. Williams, Ching-Te Chuang

Proceedings of the 2007 International Symposium on Low Power Electronics and Design, 2007

A Disturb Decoupled Column Select 8T SRAM Cell.

Vinod Ramadurai, Rajiv V. Joshi, Rouwaida Kanj

Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, 2007

2006

System-Level SRAM Yield Enhancement.

Fadi J. Kurdahi, Ahmed M. Eltawil, Young-Hwan Park, Rouwaida Kanj, Sani R. Nassif

Proceedings of the 7th International Symposium on Quality of Electronic Design (ISQED 2006), 2006

SRAM Local Bit Line Access Failure Analyses.

Praveen Elakkumanan, Jente B. Kuang, Kevin J. Nowka, Ramalingam Sridhar, Rouwaida Kanj, Sani R. Nassif

Proceedings of the 7th International Symposium on Quality of Electronic Design (ISQED 2006), 2006

Mixture importance sampling and its application to the analysis of SRAM designs in the presence of rare failure events.

Rouwaida Kanj, Rajiv V. Joshi, Sani R. Nassif

Proceedings of the 43rd Design Automation Conference, 2006

2004

SOI Circuit Design Styles and High-Level Circuit Modeling Techniques

Rouwaida Kanj

PhD thesis, 2004

Critical evaluation of SOI design guidelines.

Rouwaida Kanj, Elyse Rosenbaum

IEEE Trans. Very Large Scale Integr. Syst., 2004

Noise characterization of static CMOS gates.

Rouwaida Kanj, Timothy Lehner, Bhavna Agrawal, Elyse Rosenbaum

Proceedings of the 41th Design Automation Conference, 2004

2002

A critical look at design guidelines for SOI logic gates.

Rouwaida Kanj, Elyse Rosenbaum

Proceedings of the 2002 International Symposium on Circuits and Systems, 2002