Jeff Fan

According to our database, Jeff Fan authored at least 2 papers between 2020 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Affordable and Comprehensive Testing of 3-D Stacked Die Devices.

Jean-François Côté, Jeff Fan, Sean Shen, Givargis Danialy, Marcin Lipinski, Michael Garbers, Wu Yang, Martin Keim, Andreas Glowatz, Joe Reynick, Ayush Patel, Joanna Michna

IEEE Des. Test, 2022

2020

Using Volume Cell-aware Diagnosis Results to Improve Physical Failure Analysis Efficiency.

Hanson Peng, Mao-Yuan Hsia, Man-Ting Pang, I.-Y. Chang, Jeff Fan, Huaxing Tang, Manish Sharma, Wu Yang

Proceedings of the IEEE International Test Conference, 2020