Huaxing Tang

According to our database, Huaxing Tang authored at least 27 papers between 2002 and 2020.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2020

Using Volume Cell-aware Diagnosis Results to Improve Physical Failure Analysis Efficiency.

Hanson Peng, Mao-Yuan Hsia, Man-Ting Pang, I.-Y. Chang, Jeff Fan, Huaxing Tang, Manish Sharma, Wu Yang

Proceedings of the IEEE International Test Conference, 2020

2019

A supervised machine learning application in volume diagnosis.

Yue Tian, Gaurav Veda, Wu-Tung Cheng, Manish Sharma, Huaxing Tang, Neerja Bawaskar, Sudhakar M. Reddy

Proceedings of the 24th IEEE European Test Symposium, 2019

2018

A case study for using dynamic partitioning based solution in volume diagnosis.

Tao Wang, Zhangchun Shi, Junlin Huang, Huaxing Tang, Wu Yang, Junna Zhong

Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018

2017

Using Cell Aware Diagnostic Patterns to Improve Diagnosis Resolution for Cell Internal Defects.

Huaxing Tang, Arvind Jain, Sanil Kumark Pillai, Dharmesh Joshi, Shamitha Rao

Proceedings of the 26th IEEE Asian Test Symposium, 2017

Scan Chain Diagnosis Based on Unsupervised Machine Learning.

Yu Huang, Brady Benware, Randy Klingenberg, Huaxing Tang, Jayant Dsouza, Wu-Tung Cheng

Proceedings of the 26th IEEE Asian Test Symposium, 2017

2016

Cell-aware diagnosis: Defective inmates exposed in their cells.

Peter C. Maxwell, Friedrich Hapke, Huaxing Tang

Proceedings of the 21th IEEE European Test Symposium, 2016

2015

Diagnosing timing related cell internal defects for FinFET technology.

Huaxing Tang, Ting-Pu Tai, Wu-Tung Cheng, Brady Benware, Friedrich Hapke

Proceedings of the VLSI Design, Automation and Test, 2015

2014

Diagnose Failures Caused by Multiple Locations at a Time.

Jing Ye, Yu Hu, Xiaowei Li, Wu-Tung Cheng, Yu Huang, Huaxing Tang

IEEE Trans. Very Large Scale Integr. Syst., 2014

Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models.

Huaxing Tang, Brady Benware, Michael Reese, Joseph Caroselli, Thomas Herrmann, Friedrich Hapke, Robert Tao, Wu-Tung Cheng, Manish Sharma

Proceedings of the 23rd IEEE Asian Test Symposium, 2014

2013

Distributed dynamic partitioning based diagnosis of scan chain.

Yu Huang, Xiaoxin Fan, Huaxing Tang, Manish Sharma, Wu-Tung Cheng, Brady Benware, Sudhakar M. Reddy

Proceedings of the 31st IEEE VLSI Test Symposium, 2013

2012

Employing the STDF V4-2007 Standard for Scan Test Data Logging.

Markus Seuring, Michael Braun, Alan Ma, Geir Eide, Kathy Yang, Huaxing Tang

IEEE Des. Test, 2012

Improved volume diagnosis throughput using dynamic design partitioning.

Xiaoxin Fan, Huaxing Tang, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Brady Benware

Proceedings of the 2012 IEEE International Test Conference, 2012

2011

Deterministic IDDQ diagnosis using a net activation based model.

Andras Kun, Ralf Arnold, Peter Heinrich, Gwenolé Maugard, Huaxing Tang, Wu-Tung Cheng

Proceedings of the 2011 IEEE International Test Conference, 2011

Diagnosis of Multiple Faults Based on Fault-Tuple Equivalence Tree.

Xun Tang, Wu-Tung Cheng, Ruifeng Guo, Huaxing Tang, Sudhakar M. Reddy

Proceedings of the 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2011

On Using Design Partitioning to Reduce Diagnosis Memory Footprint.

Xiaoxin Fan, Huaxing Tang, Sudhakar M. Reddy, Wu-Tung Cheng, Brady Benware

Proceedings of the 20th IEEE Asian Test Symposium, 2011

2008

Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data.

Manish Sharma, Brady Benware, Lei Ling, David Abercrombie, Lincoln Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Reinhart Lin, Albert Mann

Proceedings of the 2008 IEEE International Test Conference, 2008

Hyperactive Faults Dictionary to Increase Diagnosis Throughput.

Chen Liu, Wu-Tung Cheng, Huaxing Tang, Sudhakar M. Reddy, Wei Zou, Manish Sharma

Proceedings of the 17th IEEE Asian Test Symposium, 2008

2007

Speeding Up Effect-Cause Defect Diagnosis Using a Small Dictionary.

Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy, Huaxing Tang

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

Interconnect open defect diagnosis with minimal physical information.

Chen Liu, Wei Zou, Sudhakar M. Reddy, Wu-Tung Cheng, Manish Sharma, Huaxing Tang

Proceedings of the 2007 IEEE International Test Conference, 2007

Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement.

Huaxing Tang, Manish Sharma, Janusz Rajski, Martin Keim, Brady Benware

Proceedings of the 12th European Test Symposium, 2007

Improving Performance of Effect-Cause Diagnosis with Minimal Memory Overhead.

Huaxing Tang, Chen Liu, Wu-Tung Cheng, Sudahkar M. Reddy, Wei Zou

Proceedings of the 16th Asian Test Symposium, 2007

2006

On Methods to Improve Location Based Logic Diagnosis.

Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy, Huaxing Tang

Proceedings of the 19th International Conference on VLSI Design (VLSI Design 2006), 2006

A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis.

Martin Keim, Nagesh Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware

Proceedings of the 2006 IEEE International Test Conference, 2006

2005

On Efficient X-Handling Using a Selective Compaction Scheme to Achieve High Test Response Compaction Ratios.

Huaxing Tang, Chen Wang, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Irith Pomeranz

Proceedings of the 18th International Conference on VLSI Design (VLSI Design 2005), 2005

Defect Aware Test Patterns.

Huaxing Tang, Gang Chen, Sudhakar M. Reddy, Chen Wang, Janusz Rajski, Irith Pomeranz

Proceedings of the 2005 Design, 2005

2003

On Reducing Test Data Volume and Test Application Time for Multiple Scan Chain Designs.

Huaxing Tang, Sudhakar M. Reddy, Irith Pomeranz

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

On Testing of Interconnect Open Defects in Combinational Logic Circuits with Stems of Large Fanout.

Sudhakar M. Reddy, Irith Pomeranz, Huaxing Tang, Seiji Kajihara, Kozo Kinoshita

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002