Givargis Danialy

Affiliations:
  • Siemens EDA, Wilsonville, OR, USA
  • Siemens Digital Industries Software, Plano, TX, USA


According to our database1, Givargis Danialy authored at least 5 papers between 1992 and 2022.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

Online presence:

On csauthors.net:

Bibliography

2022
Affordable and Comprehensive Testing of 3-D Stacked Die Devices.
IEEE Des. Test, 2022

2020
IJTAG Through a Two-Pin Chip Interface.
Proceedings of the IEEE International Test Conference, 2020

2001
Contactless digital testing of IC pin leakage currents.
Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

2000
Bridging the gap between embedded test and ATE.
Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1992
Which paradigm can improve the reliability of next-generation measurement system software.
Proceedings of the Addendum to the Proceedings on Object-Oriented Programming Systems, 1992


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