Jooyoung Bae

Orcid: 0009-0009-2677-792X

According to our database1, Jooyoung Bae authored at least 9 papers between 2018 and 2026.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book  In proceedings  Article  PhD thesis  Dataset  Other 

Links

On csauthors.net:

Bibliography

2026
NeoNet: An End-to-End 3D MRI-Based Deep Learning Framework for Non-Invasive Prediction of Perineural Invasion via Generation-Driven Classification.
CoRR, March, 2026

LUMINA: Laplacian-Unifying Mechanism for Interpretable Neurodevelopmental Analysis via Quad-Stream GCN.
CoRR, March, 2026

10.8 COBI: A Degree-of-56 Column-Bipartite Densely Connected Digital Ising Chip with 8b Spin Coefficients.
Proceedings of the IEEE International Solid-State Circuits Conference, 2026

2024
CTLE-Ising: A Continuous-Time Latch-Based Ising Machine Featuring One-Shot Fully Parallel Spin Updates and Equalization of Spin States.
IEEE J. Solid State Circuits, January, 2024

30.3 VIP-Sat: A Boolean Satisfiability Solver Featuring 5×12 Variable In-Memory Processing Elements with 98% Solvability for 50-Variables 218-Clauses 3-SAT Problems.
Proceedings of the IEEE International Solid-State Circuits Conference, 2024

15.6 e-Chimera: A Scalable SRAM-Based Ising Macro with Enhanced-Chimera Topology for Solving Combinatorial Optimization Problems Within Memory.
Proceedings of the IEEE International Solid-State Circuits Conference, 2024

15.5 LISA: A 576×4 All-in-One Replica-Spins Continuous-Time Latch-Based Ising Computer Using Massively-Parallel Random-Number Generations and Replica Equalizations.
Proceedings of the IEEE International Solid-State Circuits Conference, 2024

2023
CTLE-Ising:A 1440-Spin Continuous-Time Latch-Based isling Machine with One-Shot Fully-Parallel Spin Updates Featuring Equalization of Spin States.
Proceedings of the IEEE International Solid- State Circuits Conference, 2023

2018
A 16Gb 1.2V 3.2Gb/s/pin DDR4 SDRAM with improved power distribution and repair strategy.
Proceedings of the 2018 IEEE International Solid-State Circuits Conference, 2018


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