Kicheol Kim

According to our database, Kicheol Kim authored at least 11 papers between 2004 and 2026.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2026

Overcoming Obstacles in Passive Handcart Systems: A Quasi-Static Analysis and Passive Module Development.

Kicheol Kim, Youngsoo Kim

IEEE Access, 2026

2025

Tweezers: A Framework for Security Event Detection via Event Attribution-centric Tweet Embedding.

Jian Cui, Hanna Kim, Eugene Jang, Dayeon Yim, Kicheol Kim, Yongjae Lee, Jin-Woo Chung, Seungwon Shin, Xiaojing Liao

Proceedings of the 32nd Annual Network and Distributed System Security Symposium, 2025

2022

Multi-objective Optimization-based Bug-fixing Template Mining for Automated Program Repair.

Misoo Kim, Youngkyoung Kim, Kicheol Kim, Eunseok Lee

Proceedings of the 37th IEEE/ACM International Conference on Automated Software Engineering, 2022

Systematic Analysis of Defect-Specific Code Abstraction for Neural Program Repair.

Kicheol Kim, Misoo Kim, Eunseok Lee

Proceedings of the 29th Asia-Pacific Software Engineering Conference, 2022

2008

A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-Random Logic BIST.

Youbean Kim, Kicheol Kim, Incheol Kim, Hyunwook Son, Sungho Kang

IEICE Trans. Inf. Syst., 2008

A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters.

Kicheol Kim, Youbean Kim, Incheol Kim, HyeonUk Son, Sungho Kang

IEICE Trans. Electron., 2008

A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals.

Youbean Kim, Kicheol Kim, Incheol Kim, Sungho Kang

IEICE Trans. Electron., 2008

2007

A New Analog-to-Digital Converter BIST Considering a Transient Zone.

Incheol Kim, Kicheol Kim, Youbean Kim, HyeonUk Son, Sungho Kang

IEICE Trans. Electron., 2007

2006

TOSCA: Total Scan Power Reduction Architecture based on Pseudo-Random Built-in Self Test Structure.

Youbean Kim, Dongsup Song, Kicheol Kim, Incheol Kim, Sungho Kang

Proceedings of the 15th Asian Test Symposium, 2006

2005

A New Low Power Test Pattern Generator for BIST Architecture.

Kicheol Kim, DongSub Song, Incheol Kim, Sungho Kang

IEICE Trans. Electron., 2005

2004

Code-width testing-based compact ADC BIST circuit.

Dongmyung Lee, Kwisung Yoo, Kicheol Kim, Gunhee Han, Sungho Kang

IEEE Trans. Circuits Syst. II Express Briefs, 2004