Koichi Itaya

According to our database, Koichi Itaya authored at least 2 papers between 1997 and 2003.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2003

BIST-Aided Scan Test - A New Method for Test Cost Reduction.

Takahisa Hiraide, Kwame Osei Boateng, Hideaki Konishi, Koichi Itaya, Michiaki Emori, Hitoshi Yamanaka, Takashi Mochiyama

Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003

1997

ATREX : Design for Testability System for Mega Gate LSIs.

Michiaki Emori, Junko Kumagai, Koichi Itaya, Takashi Aikyo, Tomoko Anan, Junichi Niimi

Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997